Wu San-lein | Department Of Electronic Engineering Cheng Shiu University
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概要
関連著者
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Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Kang Ting-kuo
Department Of Electronic Engineering Cheng Shiu University
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Lin Hau-Yu
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Kuo Cheng-Wen
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Chuang Ricky
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Cheng Osbert
United Microelectronics Corp. (umc) Crd Logic Division
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Sa Yu-huan
Department Of Electronic Engineering Cheng Shiu University
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Huang Yao-Tsung
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Huang Zhen-Da
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Chiu Chiu-Jung
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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HUANG Zhen-Da
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University
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WENG Wen-Yin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University
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CHIU Chiu-Jung
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University
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Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
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Wang Bo-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
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Lu Yu-Ying
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Huang Chien-Wei
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Tsai Kai-Shiang
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Cheng Osbert
Advance Technology Development, United Microelectronics Corporation (UMC), Tainan 74145, Taiwan
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CHANG Shoou
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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CHENG Yao-Chin
United Microelectronics Corp.
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Chang Shoou
Institute Of Microelectronics & Department Of Electrical Engineering Center For Micro/nano Scien
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KANG Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University
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SA Yu-Huan
Department of Electronic Engineering, Cheng Shiu University
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HUANG Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Chang Shoou
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Huang Cheng-tung
United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D
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Lin Chung
Department Of Chemistry National Cheng Kung University
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Lin Chung
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Wu Chung
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Chen Shin-Hsin
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Wu Chung-Yi
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Kang Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Kang Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wu Chung
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Wang Bo-Chin
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Cheng Osbert
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Cheng Yao-Chin
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Chuang Ricky
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Weng Wen-Yin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Huang Cheng-Tung
United Microelectronics Corp. (UMC), CRD Logic Division, No. 18, Nanke 2nd Rd., Tainan Science Park, Sinshih Township, Tainan County 741, Taiwan 12457, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Sa Yu-Huan
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Chang Shoou-Jinn
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Huang Cheng-Tung
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
著作論文
- Investigation of Impact Ionization in Strained-Si nMOSFETs
- Impact of Reducing Shallow Trench Isolation Mechanical Stress on Active Length for 40 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- Investigation of Stress Memorization Process on Low-Frequency Noise Performance for Strained Si n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- Investigation of Impact Ionization in Strained-Si n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Analysis of Electron Tunneling Components in p+ Poly-Gate p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors from Direct Tunneling Region to Fowler–Nordheim Region
- GaN Schottky Barrier Photodetectors with a \beta-Ga2O3 Cap Layer
- Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
- Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Characterization of Oxide Traps in 28 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
- Investigation of Trap Properties in High-k/Metal Gate p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with SiGe Source/Drain Using Random Telegraph Noise Analysis
- GaN Schottky Barrier Photodetectors with a β-Ga_2O_3 Cap Layer
- Investigation of Trap Properties in High-k/Metal Gate p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with SiGe Source/Drain Using Random Telegraph Noise Analysis
- Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise (Special Issue : Solid State Devices and Materials)
- Defect properties of high-k/metal-gate metal–oxide–semiconductor field-effect transistors determined by characterization of random telegraph noise