Lee Kun-Hsien | Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan

スポンサーリンク

概要

関連著者

Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
Wang Bo-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
Lu Yu-Ying
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
Huang Chien-Wei
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan

もっと見る

著作論文

Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise (Special Issue : Solid State Devices and Materials)

スポンサーリンク