Cheng Osbert | Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
スポンサーリンク
概要
- Cheng Osbertの詳細を見る
- 同名の論文著者
- Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.の論文著者
関連著者
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Wu San
Department Of Electronic Engineering Cheng Shiu University
-
Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
-
Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
-
Chang Shoou
Institute Of Microelectronics & Department Of Electrical Engineering Center For Micro/nano Scien
-
Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
-
Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
-
Wang Bo-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
-
Lu Yu-Ying
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Huang Chien-Wei
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Chen Jone
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
-
Chang Shoou
Department Of Electrical Engineering National Cheng Kung University
-
Chang Yee
Department Of Material Science Engineering National Cheng Kung University
-
Kuo Cheng
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
-
Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
-
Huang Yao
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
-
Wu San
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
-
Wang Bo
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
-
Lu Yu
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
-
Huang Chien
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
-
Lin Yu
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Lee Kun
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation, Tainan 741, Taiwan, R.O.C.
-
Cheng Yao
Central R&D Division, United Microelectronics Corporation, Tainan 741, Taiwan, R.O.C.
-
Lin Yu
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Wu San
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
-
Huang Po
Department of Electrical Engineering, National Chi Nan University, No. 1 University Rd. Puli 545, Taiwan
-
Huang Po
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
-
Chang Ching
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
-
Lee Kun
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Chiu Hsu
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
-
Tsai Shih
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
-
Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
-
Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
-
Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
-
Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Huang Po
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
-
Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Wu San
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
-
Chen Jone
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
-
Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Chang Shoou
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
著作論文
- Characterization of Oxide Tarps in 28 nm p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
- Characterization of Oxide Traps in 28 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
- Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
- Evaluation of Interface Property and DC Characteristics Enhancement in Nanoscale n-Channel Metal–Oxide–Semiconductor Field-Effect Transistor Using Stress Memorization Technique
- Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise (Special Issue : Solid State Devices and Materials)