Chen Jone | Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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概要
- Chen Jone F.の詳細を見る
- 同名の論文著者
- Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universitの論文著者
関連著者
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Chen Jone
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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ONG T.-C.
Taiwan Semiconductor Manufacturing Company
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Tsao Chih-pin
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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Wu San
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou
Department Of Electrical Engineering National Cheng Kung University
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TSAO Chih-Pin
Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung Universi
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Chang Yee
Department Of Material Science Engineering National Cheng Kung University
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Huang Po
Department of Electrical Engineering, National Chi Nan University, No. 1 University Rd. Puli 545, Taiwan
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Chiu Hsu
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
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Tsai Shih
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Huang Po
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Wu San
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Chen Jone
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Tsao Chih-Pin
Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Chang Shoou
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
著作論文
- The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability
- Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
- The Impact of Gate-to-Source Tunneling Current on the Characterization of Metal-Oxide-Semiconductor Field-Effect Transistor's Hot-Carrier Reliability