Wu San | Department Of Electronic Engineering Cheng Shiu University
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概要
関連著者
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Wu San
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou
Institute Of Microelectronics & Department Of Electrical Engineering Center For Micro/nano Scien
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WU San
Department of Electronics Engineering, Cheng Shiu University
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Wu S
Department Of Electronics Engineering Cheng Shiu University
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Wu San
Department Of Electronics Engineering Cheng Shiu Institute Of Technology
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Chang Shoou
Department Of Electrical Engineering National Cheng Kung University
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Chang S
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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WANG Yen
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Shiraki Yasuhiro
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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CHANG Shoou
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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SHIRAKI Yasuhiro
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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Wang Yan
Department Of Electrical Engineering National Cheng Kung University
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Wang Yan
Department Of Cardiovascular Sciences Oita University School Of Medicine
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Shiraki Yasuhiro
School Of Fundamental Science And Technology Keio University
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Shiraki Y
Research Center For Silicon Nano-science Advanced Research Laboratories Musashi Institute Of Technol
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Koh Shinji
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Wang Yan
Department Of Biology Graduate University Of Chinese Academy Of Sciences
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Lin Yu
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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KOH Shinji
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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Su Chia
Department Of Electrical Engineering National Cheng Kung University
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MIURA Hidetoshi
Research Center for Advanced Science and Technology, The University of Tokyo
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Wu San
Department Of Electronics Engineering Cheng Shiu University
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Miura Hidetoshi
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Chien Pei
Department Of Electrical Engineering National Cheng Kung University
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Liu Chee
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Chen Jone
Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit
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Chen Liang
National Nano Device Laboratory
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Lin Yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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LEE Chun
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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MIURA Atsushi
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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WU San
Electronics Department, Nan Jeon Junior College of Technology & Commerce
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HAN Tzung
Department of Electrical Engineering, National Cheng Kung University
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Han Tzung
Department Of Electrical Engineering National Cheng Kung University
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Chang Yee
Department Of Material Science Engineering National Cheng Kung University
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Wang Yen
National Cheng Kung Univ. Tainan Twn
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Chang Shoou
National Cheng Kung Univ. Tainan Twn
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Huang Kuang
Department Of Electrical Engineering National Sun Yat-sen University
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Miura Atsushi
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Lee Chun
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Lin Chun
Department Of Chemistry Florida Institute Of Technoloy
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Lin Chung
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Wu Chung
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Kang Ting
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Kuo Cheng
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
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Wu Chung
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Huang Yao
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
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Wu San
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wang Bo
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Lu Yu
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Huang Chien
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Lin Yu
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Lee Kun
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation, Tainan 741, Taiwan, R.O.C.
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Lin Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
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Liu Chee
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 106, Taiwan and Electronics Research and Service Organization, Industrial Technology Research Institute, Hsinchu 310, Taiwan
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Koh Shinji
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
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Cheng Yao
Central R&D Division, United Microelectronics Corporation, Tainan 741, Taiwan, R.O.C.
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Lin Yu
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Wu San
Department of Electronics Engineering, Cheng Shiu University, 840 Sheng Ching Rd., Neau-Song, Kaohsiung, Taiwan, R.O.C.
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Wu San
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Wu San
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Chen Pang
Department of Materials Science and Engineering, Ming Shin University of Science and Technology, No. 1 Hsin Hsin Rd., Hsin Feng, Hsin Chu 304, Taiwan
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Shiraki Yasuhiro
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
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Chang Shoou
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
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Huang Po
Department of Electrical Engineering, National Chi Nan University, No. 1 University Rd. Puli 545, Taiwan
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Huang Kuang
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Han Tzung
Electronics Department, Nan Jeon Junior College of Technology & Commerce
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Huang Po
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
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Chang Ching
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan 701, Taiwan, R.O.C.
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Lee Kun
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Chiu Hsu
Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan
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Tsai Shih
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Hsu Chia
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Lai Chien
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation, Tainan 74145, Taiwan
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Huang Po
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Wu San
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Wu San
Department of Electronic Engineering, Cheng Shiu University, 840 Chengcing Road, Niaosong, Kaohsiung, Taiwan, R.O.C.
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Chen Jone
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Chang Shoou
Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Chang Shoou
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
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Chang Shoou
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Wang Yen
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
著作論文
- A Novel Triple δ-Doped SiGe Heterostructure Field-Effect Transistor
- Device Linear Improvement Using SiGe/Si Heterostructure Delta-Doped-Channel Field-Effect Transistors
- Investigation of Transport Mechanism for Strained Si n Metal-Oxide-Semiconductor Field-Effect Transistor Grown on Multi-Layer Substrate
- Strained Si_Ge_x Normal-Graded Channel P-Type Metal Oxide Semiconductor Field Effect Transistor
- High-Performance Doped-Channel Field-Effect Transistor Using Graded SiGe Channel
- A New Silicon Field-Effect Transistors with Two-Hole-Transport-Mode (HTM) Channels Grown by Molecular Beam Epitaxy (MBE)
- Characterization of Oxide Tarps in 28 nm p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
- Impact of SiN on Performance in Novel Complementary Metal–Oxide–Semiconductor Architecture Using Substrate Strained-SiGe and Mechanical Strained-Si Technology
- P-Type Enhancement-Mode SiGe Doped-Channel Field-Effect Transistor
- Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
- Evaluation of Interface Property and DC Characteristics Enhancement in Nanoscale n-Channel Metal–Oxide–Semiconductor Field-Effect Transistor Using Stress Memorization Technique
- Hole Confinement and $1/ f$ Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
- Optimized Si-Cap Layer Thickness for Tensile-Strained-Si/ Compressively Strained SiGe Dual-Channel Transistors in 0.13 μm Complementary Metal Oxide Semiconductor Technology
- Investigation of Transport Mechanism for Strained Si n Metal–Oxide–Semiconductor Field-Effect Transistor Grown on Multi-Layer Substrate