Lin Yu | Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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概要
- Lin Yu Minの詳細を見る
- 同名の論文著者
- Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwanの論文著者
関連著者
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Wu San
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou
Institute Of Microelectronics & Department Of Electrical Engineering Center For Micro/nano Scien
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Lin Yu
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
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Liu Chee
Department Of Electrical Engineering And Graduate Institute Of Electronics Engineering National Taiw
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Lin Yu
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Koh Shinji
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Shiraki Yasuhiro
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Lin Yu
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
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Liu Chee
Department of Electrical Engineering and Graduate Institute of Electronics Engineering, National Taiwan University, Taipei 106, Taiwan and Electronics Research and Service Organization, Industrial Technology Research Institute, Hsinchu 310, Taiwan
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Koh Shinji
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
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Wu San
Department of Electronics Engineering, Cheng Shiu University, 840 Sheng Ching Rd., Neau-Song, Kaohsiung, Taiwan, R.O.C.
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Wu San
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Chen Pang
Department of Materials Science and Engineering, Ming Shin University of Science and Technology, No. 1 Hsin Hsin Rd., Hsin Feng, Hsin Chu 304, Taiwan
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Shiraki Yasuhiro
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan
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Chang Shoou
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, No. 1 Ta Hseuh Road, Tainan, Taiwan, R.O.C.
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Chang Shoou
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan
著作論文
- P-Type Enhancement-Mode SiGe Doped-Channel Field-Effect Transistor
- Hole Confinement and $1/ f$ Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors