Wu Chung-Yi | Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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概要
- Wu Chung-Yiの詳細を見る
- 同名の論文著者
- Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwanの論文著者
関連著者
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Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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CHENG Yao-Chin
United Microelectronics Corp.
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Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Cheng Osbert
United Microelectronics Corp. (umc) Crd Logic Division
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Lin Hau-Yu
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Kuo Cheng-Wen
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Huang Yao-Tsung
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Cheng Osbert
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
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Cheng Yao-Chin
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
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Wang Bo-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
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Lu Yu-Ying
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Huang Chien-Wei
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
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Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
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Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
著作論文
- Investigation of Stress Memorization Process on Low-Frequency Noise Performance for Strained Si n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- Characterization of Oxide Traps in 28 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise