Lin Hau-Yu | Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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概要
- Lin Hau-Yuの詳細を見る
- 同名の論文著者
- Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwanの論文著者
関連著者
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Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Lin Hau-Yu
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Kuo Cheng-Wen
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Cheng Osbert
United Microelectronics Corp. (umc) Crd Logic Division
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Huang Yao-Tsung
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Hong De-Gong
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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CHENG Yao-Chin
United Microelectronics Corp.
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Huang Cheng-tung
United Microelectronics Corp. Specialty Technology Department Technogoly & Process Development D
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Lin Chung
Department Of Chemistry National Cheng Kung University
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Lin Chung
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Wu Chung
Department of Electronics Engineering, Cheng Shiu University, 840, Sheng Ching Rd., Neau-Song, Kaohsiung 833, Taiwan
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Chen Shin-Hsin
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Wu Chung-Yi
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Wu Chung
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan, R.O.C.
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Cheng Osbert
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Cheng Yao-Chin
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Huang Cheng-Tung
United Microelectronics Corp. (UMC), CRD Logic Division, No. 18, Nanke 2nd Rd., Tainan Science Park, Sinshih Township, Tainan County 741, Taiwan 12457, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
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Chang Shoou-Jinn
Institute of Microelectronics and Department of Electrical Engineering, Center for Micro/Nano Science and Technology, Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 70101, Taiwan
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Huang Cheng-Tung
United Microelectronics Corporation, Ltd., Tainan Science-Based Industrial Park, Tainan 74145, Taiwan
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Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
著作論文
- Impact of Reducing Shallow Trench Isolation Mechanical Stress on Active Length for 40 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- Investigation of Stress Memorization Process on Low-Frequency Noise Performance for Strained Si n-Type Metal--Oxide--Semiconductor Field-Effect Transistors
- Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal–Oxide–Semiconductor Field-Effect Transistors