Lu Yu-Ying | Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
スポンサーリンク
概要
- Lu Yu-Yingの詳細を見る
- 同名の論文著者
- Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwanの論文著者
関連著者
-
Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
-
Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
-
Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Hsinchu 30077, Taiwan, R.O.C.
-
Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
-
Wang Bo-Chin
Institute of Microelectronics and Department of Electrical Engineering, Advanced Optoelectronic Technology Center, Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 701, Taiwan
-
Lu Yu-Ying
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Huang Chien-Wei
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 833, Taiwan
-
Wu Chung-Yi
Department of Electronic Engineering, Cheng Shiu University, Niaosong, Kaohsiung 833, Taiwan
-
Cheng Osbert
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Lin Yu-Min
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
-
Lee Kun-Hsien
Central R&D Division, United Microelectronics Corporation (UMC), Tainan 744, Taiwan
著作論文
- Characterization of Oxide Traps in 28 nm n-Type Metal--Oxide--Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
- Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise (Special Issue : Solid State Devices and Materials)