Kang Ting-kuo | Department Of Electronic Engineering Cheng Shiu University
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概要
関連著者
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Kang Ting-kuo
Department Of Electronic Engineering Cheng Shiu University
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Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
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Huang Po-chin
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Sa Yu-huan
Department Of Electronic Engineering Cheng Shiu University
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CHANG Shoou
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University
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Chang Shoou
Institute Of Microelectronics & Department Of Electrical Engineering Center For Micro/nano Scien
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KANG Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University
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SA Yu-Huan
Department of Electronic Engineering, Cheng Shiu University
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HUANG Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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Chang Shoou
Institute Of Microelectronics And Department Of Electrical Engineering National Cheng Kung Universit
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Kang Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Kang Ting-Kuo
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wang Bo-Chin
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Huang Po-Chin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung University, Tainan 701, Taiwan, R.O.C.
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Su Kuan-Cheng
Reliability Engineering/Reliability Technology and Assurance Division, United Microelectronics Corporation, Hsin-Chu, Taiwan, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Sa Yu-Huan
Department of Electronic Engineering, Cheng Shiu University, No. 840, Chengching Rd., Niaosong Township, Kaohsiung County 833, Taiwan, R.O.C.
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Wang Chi-Shiun
Reliability Engineering/Reliability Technology and Assurance Division, United Microelectronics Corporation, Hsin-Chu, Taiwan, R.O.C.
著作論文
- Investigation of Impact Ionization in Strained-Si nMOSFETs
- Investigation of Impact Ionization in Strained-Si n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Analysis of Electron Tunneling Components in p+ Poly-Gate p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors from Direct Tunneling Region to Fowler–Nordheim Region
- Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Self-Heating p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors for Reliability Monitoring of Negative-Bias Temperature Instability