Cheng Osbert | Advance Technology Development, United Microelectronics Corporation (UMC), Tainan 74145, Taiwan
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概要
- 同名の論文著者
- Advance Technology Development, United Microelectronics Corporation (UMC), Tainan 74145, Taiwanの論文著者
関連著者
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Wu San-lein
Department Of Electronic Engineering Cheng Shiu University
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Wu San-Lein
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Tsai Kai-Shiang
Department of Electronic Engineering, Cheng Shiu University, Kaohsiung 83347, Taiwan
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Cheng Osbert
Advance Technology Development, United Microelectronics Corporation (UMC), Tainan 74145, Taiwan
著作論文
- Investigation of Trap Properties in High-k/Metal Gate p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with SiGe Source/Drain Using Random Telegraph Noise Analysis
- Investigation of Trap Properties in High-k/Metal Gate p-Type Metal--Oxide--Semiconductor Field-Effect Transistors with SiGe Source/Drain Using Random Telegraph Noise Analysis