Lee Ga-won | Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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概要
- 同名の論文著者
- Department Of Electrical Engineering Korea Advanced Institute Of Science And Technologyの論文著者
関連著者
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Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Han In-shik
Department Of Electronics Engineering Chungnam National University
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Jeong Kwang-seok
Department Of Electronics Engineering Chungnam National University
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Yun Ho-jin
Department Of Electronics Engineering Chungnam National University
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Kim Yu-mi
Department Of Electronics Engineering Chungnam National University
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Yang Seung-dong
Department Of Electronics Engineering Chungnam National University
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Lee Sang-youl
Department Of Electronics Engineering Chungnam National University
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KWON Hyuk-Min
Department of Electronics Engineering, Chungnam National University
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Choi Won-Ho
Department of Physiology and Anesthesiology, College of Medicine, Institute of Biomedical Science and Technology, Konkuk University
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Bok Jung-Deuk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Jung Yi-Jung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Park Sung-Soo
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Choi Won-Ho
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Choi Won-Ho
Department of Computer Engineering, University of Kyungnam
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Om Jae-Chul
Mobile & FLASH Division, Hynix Semiconductor Inc.
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Lee Seaung-Suk
Mobile & FLASH Division, Hynix Semiconductor Inc.
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Han Chul-hi
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Lee Jin-woo
Department Of Biomedical Engineering College Of Medicine Kyunghee University
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Oh Jae-sub
Department Of Electronics Engineering Chungnam National University
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Park Sang-Uk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Shin Hong-Sik
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Nam Dong-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Kim Young-Su
National Nanofab Center, Daejeon 305-806, Korea
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Bae Gi-Hyun
Mobile & FLASH Division, Hynix Semiconductor Inc.
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HAN Chul-Hi
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology
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Lee Jin-woo
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Kwon Hyuk-min
Dept. Of Electronics Engineering Chungnam National University
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Bok Jung-deuk
Dept. Of Electronics Engineering Chungnam National University
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Jammy Raj
Sematech
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Majhi Prashant
Sematech
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Lee Jin-woo
Department Of Dermatology Kosin University College Of Medicine
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OH Jungwoo
SEMATECH
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LEE Sang-Youl
Department of Electronics Engineering, Chungnam National University
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Jang Jae-Hyung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Ko Sung-Yong
DMS Co., Ltd., Suwon, Gyeonggi 443-803, Korea
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Lee Won-Mook
DMS Co., Ltd., Suwon, Gyeonggi 443-803, Korea
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Kang Chang-Yong
International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Lee Byoung-Hun
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Korea
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Jammy Raj
International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Choi Woon-Il
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Na Min-Ki
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Chai Kwang-il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Jeong Jae-Kyeong
Corporate R and D Center, Samsung SDI Co., Ltd., 428-5 Gongse-dong, Kiheung-gu, Yongin, Gyeonggi-do 449-902, Korea
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Han Chul-Hi
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology,
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Choi Kwang-Il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Byung-Seok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Joo Han-Soo
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Jeong Kwang-Seok
Department of Electronics Engineering, Chungnam National University
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Jeong Kwang-Seok
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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OH Jae-Sub
Department of Electronics Engineering, Chungnam National University
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Choi Won-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Sung-Soo
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Kim Yu-Mi
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Yang Seung-Dong
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Lee Seaung-Suk
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Lee Seaung-Suk
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Bae Gi-Hyun
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Lee Sang-Youl
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Om Jae-Chul
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Om Jae-Chul
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Han In-Shik
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Han In-Shik
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Lee Ga-Won
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology,
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CHUNG Yi-Sun
Magnachip Semiconductor Inc.
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JANG Jae-Hyung
Department of Electronics Engineering, Chungnam National University
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KWON Sung-Kyu
Department of Electronics Engineering, Chungnam National University
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Choi Deuk-Sung
Divison of Electronics & Information Engineering, Yeungnam College of Science and Technology, Daegu 705-703, Korea
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Lim Min-Gyu
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea
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Lee Jung-Hwan
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea
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Oh Se-Kyung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Kang Min-Ho
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
著作論文
- Substrate Resistance Effect on Charge-Pumping Current in Polycrystalline Silicon Thin Film Transistors
- Conduction Mechanism and Reliability Characteristics of a Metal--Insulator--Metal Capacitor with Single ZrO2 Layer
- Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering
- Effect of nitrogen concentration on low-frequency noise and negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with nitrided gate oxide (Special issue: Dielectric thin films for future electron devices: s
- Improvement of Thermal Stability of Ni-Germanide with Ni/Co/Ni/TiN Structure for High Performance Ge Metal-Oxide-Semiconductor Field Effect Transistors (Special Issue : Solid State Devices and Materials (1))
- Extraction of Energy Distribution of Nitride Traps Using Charge Pumping Method in Silicon–Oxide–Nitride–Oxide–Silicon Flash Memory
- Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O Ambient (Special Issue : Advanced Electromaterials)
- Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO2 and S3N4 as Trapping Layer
- Dependence of Hot Carrier Reliability and Low Frequency Noise on Channel Stress in Nanoscale n-Channel Metal--Oxide--Semiconductor Field-Effect Transistors
- Electrical Instabilities in Amorphous InGaZnO Thin Film Transistors with Si3N4 and Si3N4/Al2O3 Gate Dielectrics
- Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO_2 and S_3N_4 as Trapping Layer
- New Charge Pumping Method for Characterization of Charge Trapping Layer in Oxide–Nitride–Oxide Structure
- Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis (Special Issue : Solid State Devices and Materials)
- Substrate Resistance Effect on Charge-Pumping Current in Polycrystalline Silicon Thin Film Transistors