Bok Jung-deuk | Dept. Of Electronics Engineering Chungnam National University

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Analysis of Transfer Gate in CMOS Image Sensor(Session 6A : TFTs and Sensors)
Analysis of Transfer Gate in CMOS Image Sensor(Session 6A : TFTs and Sensors)
Effect of nitrogen concentration on low-frequency noise and negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with nitrided gate oxide (Special issue: Dielectric thin films for future electron devices: s
Dependence of hot carrier reliability and low frequency noise on channel stress in nanoscale n-channel metal-oxide-semiconductor field-effect transistors (Special issue: Dielectric thin films for future electron devices: science and technology)

スポンサーリンク