Lee Jung-Hwan | MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea

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概要

関連著者

Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
Kwon Hyuk-min
Dept. Of Electronics Engineering Chungnam National University
Bok Jung-deuk
Dept. Of Electronics Engineering Chungnam National University
Han In-shik
Department Of Electronics Engineering Chungnam National University
Bok Jung-Deuk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
Jung Yi-Jung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
Choi Woon-Il
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
CHUNG Yi-Sun
Magnachip Semiconductor Inc.
KWON Hyuk-Min
Department of Electronics Engineering, Chungnam National University
KWON Sung-Kyu
Department of Electronics Engineering, Chungnam National University
Choi Deuk-Sung
Divison of Electronics & Information Engineering, Yeungnam College of Science and Technology, Daegu 705-703, Korea
Lim Min-Gyu
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea
Lee Jung-Hwan
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea

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著作論文

Effect of nitrogen concentration on low-frequency noise and negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with nitrided gate oxide (Special issue: Dielectric thin films for future electron devices: s

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