Kwon Hyuk-min | Dept. Of Electronics Engineering Chungnam National University

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著作論文

Analysis of Transfer Gate in CMOS Image Sensor(Session 6A : TFTs and Sensors)
Analysis of Transfer Gate in CMOS Image Sensor(Session 6A : TFTs and Sensors)
Ramping Amplitude Multi-Frequency Charge Pumping Technique for Silicon-Oxide-Nirtride-Oxide-Silicon Flash EEPROM Cell Transistors
Effect of nitrogen concentration on low-frequency noise and negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with nitrided gate oxide (Special issue: Dielectric thin films for future electron devices: s
Dependence of hot carrier reliability and low frequency noise on channel stress in nanoscale n-channel metal-oxide-semiconductor field-effect transistors (Special issue: Dielectric thin films for future electron devices: science and technology)
Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

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