CHUNG Yi-Sun | Magnachip Semiconductor Inc.
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概要
関連著者
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CHUNG Yi-Sun
Magnachip Semiconductor Inc.
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LEE Da-Soon
Magnachip Semiconductor Inc.
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Kwon Hyuk-min
Dept. Of Electronics Engineering Chungnam National University
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Jung Yi-Jung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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KWON Hyuk-Min
Department of Electronics Engineering, Chungnam National University
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KWON Sung-Kyu
Department of Electronics Engineering, Chungnam National University
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KWON Hyuk-Min
the Department of Electronics Engineering, Chungnam National University
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HWANG Seon-Man
the Department of Electronics Engineering, Chungnam National University
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JANG Jae-Hyung
the Department of Electronics Engineering, Chungnam National University
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KWAK Ho-Young
the Department of Electronics Engineering, Chungnam National University
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KWON Sung-Kyu
the Department of Electronics Engineering, Chungnam National University
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SUNG Seung-Yong
the Department of Electronics Engineering, Chungnam National University
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SHIN Jong-Kwan
the Department of Electronics Engineering, Chungnam National University
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LEE Hi-Deok
the Department of Electronics Engineering, Chungnam National University
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Lee Hi-deok
Dept. Of Electronics Engineering Chungnam National Univ.
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Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Bok Jung-deuk
Dept. Of Electronics Engineering Chungnam National University
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Han In-shik
Department Of Electronics Engineering Chungnam National University
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Bok Jung-Deuk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Kwak Ho-Young
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Choi Woon-Il
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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LEE Hi-Deok
Dept. of Electronics Engineering, Chungnam National Univ.
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SHIN Jong-Kwan
Dept. of Electronics Engineering, Chungnam National Univ.
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SHIN Jong-Kwan
Department of Electronics Engineering, Chungnam National University
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JANG Jae-Hyung
Dept. of Electronics Engineering, Chungnam National Univ.
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JANG Jae-Hyung
Department of Electronics Engineering, Chungnam National University
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HWANG Seon-Man
Department of Electronics Engineering, Chungnam National University
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SUNG Seung-Yong
Department of Electronics Engineering, Chungnam National University
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KWAK Ho-Young
Dept. of Electronics Engineering, Chungnam National Univ.
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KWON Sung-Kyu
Dept. of Electronics Engineering, Chungnam National Univ.
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HWANG Seon-Man
Dept. of Electronics Engineering, Chungnam National Univ.
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SUNG Seung-Yong
Dept. of Electronics Engineering, Chungnam National Univ.
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KWAK Ho-Young
Department of Electronics Engineering, Chungnam National University
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Choi Deuk-Sung
Divison of Electronics & Information Engineering, Yeungnam College of Science and Technology, Daegu 705-703, Korea
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Lim Min-Gyu
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea
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Lee Jung-Hwan
MagnaChip Semiconductor Ltd., Cheongju, Chungbuk 361-725, Korea
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KWON Hyuk-Min
the Dept. of Electronics Engineering, Chungnam National Univ.
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JUNG Yi-Jung
the Department of Electronics Engineering, Chungnam National University
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KWON Sung-Kyu
the Dept. of Electronics Engineering, Chungnam National Univ.
著作論文
- Effect of nitrogen concentration on low-frequency noise and negative bias temperature instability of p-channel metal-oxide-semiconductor field-effect transistors with nitrided gate oxide (Special issue: Dielectric thin films for future electron devices: s
- Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
- Novel PNP BJT Structure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications
- Novel PNP BJT S tructure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications
- Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs