Park Sung-Soo | Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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概要
- Park Sung-Sooの詳細を見る
- 同名の論文著者
- Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Koreaの論文著者
関連著者
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Choi Won-Ho
Department of Physiology and Anesthesiology, College of Medicine, Institute of Biomedical Science and Technology, Konkuk University
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Park Sung-Soo
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Choi Won-Ho
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Choi Won-Ho
Department of Computer Engineering, University of Kyungnam
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Om Jae-Chul
Mobile & FLASH Division, Hynix Semiconductor Inc.
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Lee Seaung-Suk
Mobile & FLASH Division, Hynix Semiconductor Inc.
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Han In-shik
Department Of Electronics Engineering Chungnam National University
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Nam Dong-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Bae Gi-Hyun
Mobile & FLASH Division, Hynix Semiconductor Inc.
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Na Min-Ki
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Chai Kwang-il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Jeong Jae-Kyeong
Corporate R and D Center, Samsung SDI Co., Ltd., 428-5 Gongse-dong, Kiheung-gu, Yongin, Gyeonggi-do 449-902, Korea
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Choi Kwang-Il
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Byung-Seok
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Joo Han-Soo
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Choi Won-Ho
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Park Sung-Soo
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Seaung-Suk
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Lee Seaung-Suk
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Bae Gi-Hyun
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, Yusong-gu, Daejeon 305-764, Korea
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Lee Ga-Won
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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Om Jae-Chul
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Korea
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Om Jae-Chul
Mobile and FLASH Division, Hynix Semiconductor Inc., Icheon, Kyoungki 467-701, Republic of Korea
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Han In-Shik
Department of Electronics Engineering, Chungnam National University, 220 Gung-dong, Yuseong-gu, Daejeon 305-764, Republic of Korea
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KWON Hyuk-Min
Department of Electronics Engineering, Chungnam National University
著作論文
- Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering
- Extraction of Energy Distribution of Nitride Traps Using Charge Pumping Method in Silicon–Oxide–Nitride–Oxide–Silicon Flash Memory
- New Charge Pumping Method for Characterization of Charge Trapping Layer in Oxide–Nitride–Oxide Structure