Kim Young-Su | National Nanofab Center, Daejeon 305-806, Korea
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概要
関連著者
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Jeong Kwang-seok
Department Of Electronics Engineering Chungnam National University
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Yun Ho-jin
Department Of Electronics Engineering Chungnam National University
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Kim Yu-mi
Department Of Electronics Engineering Chungnam National University
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Yang Seung-dong
Department Of Electronics Engineering Chungnam National University
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Lee Sang-youl
Department Of Electronics Engineering Chungnam National University
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Kim Young-Su
National Nanofab Center, Daejeon 305-806, Korea
著作論文
- Electrical Characteristic Analysis of Postannealed ZnO Thin-Film Transistors under O Ambient (Special Issue : Advanced Electromaterials)
- Investigation of the Gate Bias Stress Instability in ZnO Thin Film Transistors by Low-Frequency Noise Analysis (Special Issue : Solid State Devices and Materials)