Lee Byoung-Hun | Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Korea

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概要

• Lee Byoung-Hunの詳細を見る
• 同名の論文著者
• Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Koreaの論文著者

関連著者

• Lee Hi-deok

  Department Of Electronics Engineering Chungnam National University

• Han In-shik

  Department Of Electronics Engineering Chungnam National University

• Kwon Hyuk-Min

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Park Sang-Uk

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Jung Yi-Jung

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Kang Chang-Yong

  International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.

• Lee Byoung-Hun

  Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Korea

• Jammy Raj

  International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.

• KWON Hyuk-Min

  Department of Electronics Engineering, Chungnam National University

• Kwak Ho-Young

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Choi Woon-Il

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Ha Man-Lyun

  Dongbu HiTec Semiconductor Inc., Seoul 891-10, Korea

• Lee Ju-Il

  Dongbu HiTec Semiconductor Inc., Seoul 891-10, Korea

• KWAK Ho-Young

  Department of Electronics Engineering, Chungnam National University

• Lee Ga-won

  Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology

• Bok Jung-Deuk

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Shin Hong-Sik

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Jammy Raj

  International SEMATECH, Austin, TX 78741, U.S.A.

• Lee Hi-Deok

  Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea

• Kang Chang-Yong

  International SEMATECH, Austin, TX 78741, U.S.A.

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著作論文

• Conduction Mechanism and Reliability Characteristics of a Metal--Insulator--Metal Capacitor with Single ZrO2 Layer
• Erratum: ``Comparison of Multilayer Dielectric Thin Films for Future Metal--Insulator--Metal Capacitors: Al2O3/HfO2/Al2O3 versus SiO2/HfO2/SiO2''
• Comparison of Multilayer Dielectric Thin Films for Future Metal--Insulator--Metal Capacitors: Al2O3/HfO2/Al2O3 versus SiO2/HfO2/SiO2

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