Shin Hong-Sik | Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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概要
- Shin Hong-Sikの詳細を見る
- 同名の論文著者
- Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Koreaの論文著者
関連著者
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Lee Ga-won
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology
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Shin Hong-Sik
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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KWON Hyuk-Min
Department of Electronics Engineering, Chungnam National University
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Jammy Raj
Sematech
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Han In-shik
Department Of Electronics Engineering Chungnam National University
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Majhi Prashant
Sematech
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OH Jungwoo
SEMATECH
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Kwon Hyuk-Min
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Bok Jung-Deuk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Park Sang-Uk
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Jung Yi-Jung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Kang Chang-Yong
International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Lee Byoung-Hun
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology (GIST), Gwangju 500-712, Korea
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Jammy Raj
International SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Lee Hi-Deok
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Oh Se-Kyung
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
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Kang Min-Ho
Department of Electronics Engineering, Chungnam National University, Daejeon 305-764, Korea
著作論文
- Conduction Mechanism and Reliability Characteristics of a Metal--Insulator--Metal Capacitor with Single ZrO2 Layer
- Improvement of Thermal Stability of Ni-Germanide with Ni/Co/Ni/TiN Structure for High Performance Ge Metal-Oxide-Semiconductor Field Effect Transistors (Special Issue : Solid State Devices and Materials (1))