Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO_2 and S_3N_4 as Trapping Layer

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概要

• 論文の詳細を見る
• 2012-05-01

著者

• Lee Hi-deok

  Department Of Electronics Engineering Chungnam National University

• Lee Ga-won

  Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology

• Jeong Kwang-seok

  Department Of Electronics Engineering Chungnam National University

• Yun Ho-jin

  Department Of Electronics Engineering Chungnam National University

• Oh Jae-sub

  Department Of Electronics Engineering Chungnam National University

• Kim Yu-mi

  Department Of Electronics Engineering Chungnam National University

• Yang Seung-dong

  Department Of Electronics Engineering Chungnam National University

• LEE Sang-Youl

  Department of Electronics Engineering, Chungnam National University

• Lee Sang-youl

  Department Of Electronics Engineering Chungnam National University

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