Novel Nitrogen Doped Ni Self-Alingned Silicide Process for Nanoscale Complementary Metal Oxide Semiconductor Technology
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概要
- 論文の詳細を見る
In this paper, 1%-nitrogen doped nickel was proposed to improve the thermal stability of Ni-silicide for nano-scale N-type Metal Oxide Semiconductor Field Effect Transistor. It is shown that thermal stability of nickel silicide is improved a lot by the Nitrogen incorporation in NiSi layer using the 1%-nitrogen doped nickel target. Even after post-silicidation annealing at 650°C for 30 min, the low resistivity NiSi with low junction leakage current can be achieved. Moreover, improved device characteristics such as threshold voltage, transconductance, and on-off current, subthreshold slope were obtained in 80 nm NMOSFET.
- 2005-04-15
著者
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YUN Jang-Gn
Department of Electronics Engineering, Chungnam National University
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OH Soon-Young
Department of Electronics Engineering, Chungnam National University
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HUANG Bin-Feng
Department of Electronics Engineering, Chungnam National University
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Kim Yong-Jin
Department of Internal Medicine, Cardiovascular Center, Seoul National University Hospital
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Lee Hi-deok
Department Of Electronics Engineering Chungnam National University
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Wang Jin-suk
Department Of Electronics Engineering Chungnam National University
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KIM Ui-Sik
R&D Center, MagnaChip Semiconductor Ltd.
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CHA Han-Seob
R&D Center, MagnaChip Semiconductor Ltd.
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HEO Sang-Bum
R&D Center, MagnaChip Semiconductor Ltd.
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LEE Jeong-Gun
R&D Center, MagnaChip Semiconductor Inc.
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Ji Hee-hwan
Department Of Electronics Engineering Chungnam National University
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Heo Sang-Bum
R&D Center, MagnaChip Semiconductor Inc., Hyangjeong, Hungduk-Gu, Cheongju, Choongbuk 361-725, Korea
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Lee Jeong-Gun
R&D Center, MagnaChip Semiconductor Inc., Hyangjeong, Hungduk-Gu, Cheongju, Choongbuk 361-725, Korea
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Kim Yong-Jin
Department of Electronics Engineering, Chungnam National University, 220 Gung-Dong, Yuseong-gu, Daejeon 305-764, Korea
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Kim Ui-Sik
R&D Center, MagnaChip Semiconductor Inc., Hyangjeong, Hungduk-Gu, Cheongju, Choongbuk 361-725, Korea
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Yun Jang-Gn
Department of Electronics Engineering, Chungnam National University, 220 Gung-Dong, Yuseong-gu, Daejeon 305-764, Korea
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Cha Han-Seob
R&D Center, MagnaChip Semiconductor Inc., Hyangjeong, Hungduk-Gu, Cheongju, Choongbuk 361-725, Korea
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