Grain Enlargement of Polycrystalline Silicon by Multipulse Excimer Laser Annealing: Role of Hydrogen
スポンサーリンク
概要
- 論文の詳細を見る
The role of hydrogen introduced into melt-Si during excimer laser annealing (ELA) is examined from the viewpoint of grain enlargement. An amorphous silicon (a-Si)/SiN/quartz glass structure is successfully prepared by a catalytic chemical vapor deposition (Cat-CVD) method for a SiN film, in which the hydrogen concentration of the SiN film is controlled. The grain size increases as the hydrogen concentration decreases, and it partially exceeds 2 μm when the hydrogen concentration of the SiN film is fixed at 2.3 at. %. The relationship between defects at grain boundary and hydrogen is also considered.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-04-15
著者
-
Miyoshi Tadaki
Department Of Electrical And Electronic Engineering
-
KITAMON Yoshitaka
Department of Electrical and Electronic Engineering, Yamaguchi University
-
Kawamoto Naoya
Department Of Electrical And Electronic Engineering Yamaguchi University
-
Matsumura Hideki
School Of Materials Science Jaist (japan Advanced Institute Of Science And Technology)
-
Matsuo Naoto
Department Of Electrical And Electronic Engineering Yamaguchi University
-
Hamada Hiroki
Frontier Devices Research Center, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Masuda Atsushi
School of Material Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan
-
Seri Yasuhiro
School of Material Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan
-
Nishimori Toshimasa
Department of Electrical and Electronic Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube, Yamaguchi 755-8611, Japan
-
Matsuo Naoto
Department of Electrical & Electronic Engineering, Yamaguchi University
-
Matsuo Naoto
Department of Materials Science and Chemistry, Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280, Japan
-
Kawamoto Naoya
Department of Electrical and Electronic Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube, Yamaguchi 755-8611, Japan
-
Miyoshi Tadaki
Department of Electrical & Electronic Engineering, Yamaguchi University
-
Miyoshi Tadaki
Department of Electrical and Electronic Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube, Yamaguchi 755-8611, Japan
-
Kitamon Yoshitaka
Department of Electrical and Electronic Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube, Yamaguchi 755-8611, Japan
-
Matsumura Hideki
School of Material Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan
-
Kawamoto Naoya
Department of Electrical & Electronic Engineering, Yamaguchi University, 2557 Tokiwadai, Ube 755-8611, Japan
関連論文
- Influence of Laser Plasma Soft X-Ray Irradiation on Crystallization of a-Si Film by Infrared Furnace Annealing
- Low-Resistivity Phosphorus-Doped Polycrystalline Silicon Thin Films Formed by Catalytic Chemical Vapor Deposition and Successive Rapid Thermal Annealing
- Catalytic Chemical Sputtering: A Novel Method for Obtaining Large-Grain Polycrystalline Silicon : Surfaces, Interfaces, and Films
- A Novel Nanoscale Metal Transistor Fabricated by Conventional Photolithography
- Photodarkening and photobrightening in glasses doped with CdS and CdS_xSe_<1-x>nanocrystals
- Growth of Polycrystalline Silicon Grains
- Influence of Post Excimer Laser Annealing on Crystallinity of Precursor Polycrystalline Si Film Formed by Solid Phase Crystallization
- Role of Hydrogen in Polycrystalline Si by Excimer Laser Annealing
- Crystal Growth of Low-Temperature Processed Poly-Si by Excimer Laser Annealing - Dependences of Poly-Si Grain on Energy Density and Shot Number -
- Influence of Hydrogen in a-Si on Recrystallization of Low-Temperature Processed Poly-Si Film by Excimer Laser Annealing
- Extension of Physical Limit of Conventional Metal-Oxide-Semiconductor Transistor by Double Barriers Formed at the Channel Edges
- Study of Crystal Growth Mechanism for Poly-Si Film Prepared by Excimer Laser Annealing
- Analysis of Direct Tunneling for Thin SiO_2 Film
- Analysis of Direct Tunneling for Thin SiO_2 Film
- Influence of Microroughness of Si and Native Oxide on Adsorption of Organic Carbon in Water
- Thermoluminescence of light and X-ray irradiated semiconductor-doped glasses
- Thermoluminescence of Photodarkened CdS-Doped Glasses
- Effects of glass composition on photodarkening in CdS-doped glasses
- Influence of microcrystallite size on photodarkening effects in CdS-doped glasses
- Transient Characteristics of Luminescence from Barrier-Doped ZnSe:Te-(CdSe)_m(ZnSe)_n Short-Period Superlattice Quantum Well
- CdS-doped glass as dosimetric material with electron spin resonance
- Dependence of photodarkening on alloy composition of CdSxSe_<1-x> nanocrystals in glasses
- Laser-induced reversion of photodarkening in CdS-doped glass
- Effect of hydrogenation on photodarkening in CdS-doped glass
- Mechanism of Photodarkening Effects in CdS-Doped Glass
- ESR of photodarkened CdS-doped and undoped glasses
- Effects of light irradiation on fluorescence and optical reflectance of pearls
- Structural Analysis of Hydrogenated a-Si Films by Reverse Monte Carlo Simulation
- Atomic Hydrogen Annealing of Gate Dielectric in Pentacene Organic Thin-Film Transistors
- Grain Morphology of Recrystallized Polycrystalline-Si Film by Excimer Laser Annealing
- Determination of composition of CdS_xSe_<1-x> microcrystals in semiconductor-doped glasses using Raman scattering
- Transient characteristics of luminescence from CdS-doped glass
- Theoretical Consideration of a New Nanometer Transistor Using Metal/Insulator Tunnel-Junction
- Nanometer Pattern-Mask Fabricated by Conventional Photolithography
- 10-nm-Size Fabrication of Semiconductor Substrates and Metal Thin Lines by Conventional Photolithography
- Time-resolved luminescence spectra of porous Si
- Evidence for Defect Creation by Light Irradiation in CdSSe-Doped Glass
- Nucleation of Polycrystalline Silicon Grains
- Photoinduced formation of CdSSe nanocrystals in glass
- Thermoluminescence of Laser-Irradiated Mg2SiO4:Tb
- Radical Species Formed by the Catalytic Decomposition of NH3 on Heated W Surfaces
- Effects of High Nitrogen Pressure and Thermal Treatment on Adhesion to Amorphous Silicon/Silicon Nitride/Polyethersulfone Substrate during Excimer Laser Annealing
- Thermoluminescence of X-ray-irradiated CdS-doped glass
- Study of Silicidation Process of Tungsten Catalyzer during Silicon Film Deposition in Catalytic Chemical Vapor Deposition
- Effects of Oxygen Gas Addition and Substrate Cooling on Preparation of Amorphous Carbon Nitride Films by Magnetron Sputtering
- Effect of Laser Plasma X-ray Irradiation on Nucleation in Amorphous Silicon Film
- Effect of Laser-Plasma X-Ray Irradiation on Crystallization of Amorphous Silicon Film by Excimer Laser Annealing
- Study on Stability of Amorphous Silicon Thin-Film Transistors Prepared by Catalytic Chemical Vapor Deposition
- Mass-Spectrometric Studies of Catalytic Chemical Vapor Deposition Processes of Organic Silicon Compounds Containing Nitrogen
- Decomposition of Pentacene Molecules by Heated Tungsten Mesh
- Effect of Hydrogen and Thermal Conductivity on Nucleation of Polycrystalline Si by Excimer Laser Annealing
- Grain Enlargement of Polycrystalline Silicon by Multipulse Excimer Laser Annealing: Role of Hydrogen
- Correlation between O/Er Content Ratio and Photoluminescence Intensity of (Er, O)-Doped Hydrogenated Amorphous Si Thin Films Prepared by a Catalytic Chemical Vapor Deposition/Laser Ablation Hybrid Process
- Complementary Metal–Oxide–Semiconductor Ion-Sensitive Field-Effect Transistor Sensor Array with Silicon Nitride Film Formed by Catalytic Chemical Vapor Deposition as an Ion-Sensitive Membrane
- Novel Nano-Fabrication Technique with Low Edge Roughness
- Quantification of Gas-Phase H-Atom Number Density by Tungsten Phosphate Glass
- Effect of hydrogenation on photodarkening in CdS-doped glass
- Photoinduced formation of semiconductor nanocrystals in CdS-doped glasses
- Relationship between Textured Structure of Substrates and Defect Density of Catalytic Chemical Vapor Deposition Amorphous Silicon Films
- Internal Stress in Polycrystalline Si Film Recrystallized by Excimer Laser Annealing
- Thermoluminescence of photodarkened CdS-doped glasses
- Crystallization of Si
- Influence of Microroughness of Si and Native Oxide on Adsorption of Organic Carbon in Water
- Thermoluminescence of X-ray-irradiated CdS-doped glass