Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
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概要
- 論文の詳細を見る
Standard ellipsometry is usually applied for the evaluation of an optical isotropic system, but it is insufficient to analyze light reflected from an anisotropic system such as a liquid crystal (LC) cell. In order to analyze the light reflected from the LC cell, the standard ellipsometry system combined with the photo elastic modulator was extended to renormalized ellipsometry by introducing the definition of the renormalized reflection coefficients without any modification of the conventional experimental procedure. The experimental results such as the ellipsometric angles versus the rotation angle of the LC cell and the dependence of the ellipsometric angles on the applied electric field were in good agreement with the theoretical results based on renormalized ellipsometry. From these results, it was confirmed that renormalized ellipsometry was quite a useful technique to analyze the totally reflected light from the LC cell.
- 2001-05-15
著者
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Akao Ken-ichi
JASCO Corporation
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TADOKORO Toshiyasu
JASCO Corporation
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Okutani Satoshi
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Kimura Munehiro
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Toriumi Hirokazu
Department Of Chemistry College Of Arts And Science The University Of Tokyo
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Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
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Okutani Satoshi
Department of Electrical Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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Akahane Tadashi
Department of Electrical Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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