Two-Dimensional Analysis of Liquid Crystal Orientation at In-Plane Switching Substrate Surface Using a Near-Field Scanning Optical Microscope
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概要
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The microscopic liquid crystal (LC) orientation distribution in an in-plane switching (IPS) LC display device has been studied using a near-field scanning optical microscope (NSOM). The new NSOM system, which features an improved metal-coated optical fiber probe and is specifically designed for LC orientation analysis, has enabled successful visualization of the two-dimensional LC orientation distribution at the substrate surface. The observed NSOM images can be reproduced by theoretical simulations. These images together with the simulations reveal that the uneven-level structure of the interdigitated electrodes causes the asymmetric local LC orientation distribution near the electrode edges.
- 2003-01-15
著者
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Toriumi Hirokazu
Department Of Chemistry College Of Arts And Science The University Of Tokyo
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Saiki Toshiharu
Special Research Laboratory for Optical Science, Kanagawa Academy of Science and Technology, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan
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Tadokoro Toshiyasu
Special Research Laboratory for Optical Science, Kanagawa Academy of Science and Technology, 3-2-1 Sakado, Takatsu-ku, Kawasaki 213-0012, Japan
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Toriumi Hirokazu
Department of Chemistry, College of Arts and Science, The University of Tokyo, 3-8-1 Komaba, Meguro-ku, Tokyo 153-8902, Japan
関連論文
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- Two-Dimensional Analysis of Liquid Crystal Orientation at In-Plane Switching Substrate Surface Using a Near-Field Scanning Optical Microscope
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