Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry : Structure and Mechanical and Thermal Properties of Condensed Matter
スポンサーリンク
概要
- 論文の詳細を見る
The reorientation dynamics of surface-stabilized ferroelectric liquid crystals (SSFLCs) at the substrate surface have been studied by time-resolved spectroellipsometry (TRSE). The results of total-reflection TRSE indicate that the surface motion of SSFLC molecules is hindered by a strong anchoring system. The observed dependence of the ellipsometric parameter Ψ on the orienting layer material is discussed in terms of the competitive effects of the surface tilt angle and the strength of the surface anchoring effect. It is also demonstrated that TRSE can analyze the mode of motion of SSFLC molecules in three-dimensional space and can therefore characterize the hysteresis properties of the SSFLC cell in terms of its structural changes.
- 2001-05-01
著者
-
Akao Ken-ichi
Spectroscopic Instruments Division Jasco Corporation
-
YOSHIHARA Toshiaki
Display Laboratory, Fujitsu Laboratories Ltd.
-
Okutani Satoshi
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
-
Kimura Munehiro
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
-
Toriumi Hirokazu
Department Of Chemistry College Of Arts And Science The University Of Tokyo
-
Tadokoro Toshiyasu
Spectroscopic Instruments Division Jasco Corporation
-
Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
関連論文
- Determination of the Anisotropic Refractive Indices of Twisted Nematic Liquid Crystals by Means of Renormalized Transmission Ellipsometry : Instrumentation, Measurement, and Fabrication Technology
- (100)-Oriented 3C-SiC Polycrystalline Film Grown on SiO_2 by Hot-Mesh Chemical Vapor Deposition Using Monomethylsilane and Hydrogen
- Design and Implementation of Near-Field Scanning Optical Microscope for Observation of Interfacial Liquid Crystal Orientation : Structure and Mechanical and Thermal Properties of Condensed Matter
- Determination of Film Thickness and Anisotropy of the Refractive Indices in 4-octyl-4'-cyanobiphenyl Liquid Crystalline Free-Standing Films
- Influence of Deformation of Smectic Layer Structure on Dielectric Behavior of Ferroelectric Liquid Crystal
- Novel Measurement Method for Flexoelectric Coefficients of Nematic Liquid Crystals
- Quantitative Analysis of Nematic Director Reorientation Dynamics Studied by Time-Resolved Spectroscopic Ellipsometry
- Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry : Structure and Mechanical and Thermal Properties of Condensed Matter
- Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
- Dynamic Response of Surface-Stabilized Ferroelectric Liquid Crystals : Effect of Alignment Films
- Renormalized Ellipsometry for Determining the Anisotropic Refractive Indices of Nematic Liquid Crystals
- Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry
- Analysis of Liquid Crystal Orientation at Interface between Liquid Crystal and Alignment Film by Total Reflection Ellipsometry
- Polar Anchoring Effect on Bistable Nematic Liquid Crystal Display
- Investigation of Antiferroelectric Liquid Crystalline Free-Standing Films by Transmission Ellipsometry
- A Consideration on Expression of the Elastic Free Energy of Chiral Smectic C Liquid Crystals
- A Study of the Anomalous Transmission (Borrmann Effect) for Obliquely Incident Light in an Absorbing Single-Domain Cholesterie Liquid Crystal
- Measurement of Elastic Constant and Intrinsic Twist of Ferroelectric SmC^* Liquid Crystal
- Temperature Dependence of Selective Reflection in Ferroelectric SmC^* Liquid Crystal : Condensed Matter
- Dispersion Relation of Optical Eigen Modes in Ferroelectric SmC^* Distorted by an Electric Field
- Structure of Microcrystalline Silicon Carbide Films Prepared by Hydrogen-Radical-Enhanced Chemical Vapor Deposition in Magnetic Field ( Plasma Processing)
- Extensive Control of Plasma Parameters in the Afterglow Region of Electron-Cyclotron-Resonance Plasma for the Epitaxial Growth of Cubic Gallium Nitride
- Field-Induced Biaxiality in SmA Phase of a Liquid Crystal Exhibiting Electroclinic Effect
- Effect of Polarization Field on Elastic Deformation in a 180° Twisted Sample of Chiral Smectic C Liquid Crystal
- Chevron Layer Structure and Focal Conics in Chiral Smectic C Liquid-Crystal Cells Aligned by SiO Oblique Evaporation Technique
- Nematic Director Reorientation Dynamics Studied by Time-Resolved Fourier-Transform Infrared Spectroscopy
- Evaluation of Alignment of Nematic Liquid Crystal Thin Film by Spectroscopic Ellipsometry
- Study of Liquid Crystal Alignment Formed Using Slit Coater
- Determination of Polar Anchoring Strength for Polymer-Stabilized Blue Phase Liquid Crystal Device
- Two-Dimensional Analysis of Liquid Crystal Orientation at In-Plane Switching Substrate Surface Using a Near-Field Scanning Optical Microscope
- Preparation of Microcrystalline Silicon Carbide Films by Hydrogen-Radical-Enhanced Chemical Vapor Deposition Using Tetramethylsilane
- Dynamic Responses of Ferroelectric Liquid Crystals in the Surface-Stabilized Geometry I : Condensed matter
- Infrated Spectroscopic Study on the Structural Property of a Trehalose-Water Complex
- Dynamic Response of Surface-Stabilized Ferroelectric Liquid Crystals with Chevron Layer Structure
- High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope
- Real Time Analysis of Liquid Crystal Surface Orientation Dynamic Using Polarization Modulated Spectroellipsometry
- Layer Structure Reformation of Surface-Stabilized Ferroelectric Liquid Crystal Treated with Electric Field
- Novel Method of Measuring Surface Torsional Anchoring Strength of Nematic Liquid Crystals
- Measurement of Refractive Indices of Ferroelectric SmC^* Liquid Crystal by the Fabry-Perot Interference Method
- Quantitative Analysis of Nematic Director Reorientation Dynamics Studied by Time-Resolved Spectroscopic Ellipsometry
- Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
- Heat Pulse Method for Determination of Thermal Diffusivity of Liquid Crystals
- Focal Conic Structures in Homogeneously Aligned Chiral Smectic C Liquid-Crystal Cells
- A Molecular Statistical Theory of Smectic A Liquid Crystals
- A Molecular Field Treatment of Nematic Liquid Crystalline Mixtures.II.Calculations of Nematic-Isotropic Transition Temperatures for Binary Systems with 4,4-Di-n-alkoxyazoxybenzenes
- A Molecular Statistical Theory of Smectic A Liquid Crystalline Mixtures:Thermal Stability of Smectic A Phase in Binary Mixtures
- A Study of Homogeneous-Twist Transitions in Surface Stabilized Ferroelectric Liquid Crystal Cells
- Lattice Model Studies of Nematic Liquid Crystalline Mixtures:Effects of Molecular Flexibility
- A Molecular Field Theory of Lipid Systems
- Optical Properties of 4-Octyl-4$'$-Cyanobiphenyl Liquid-Crystalline Free-Standing Films
- A New Type of Electrohydrodynamic Instability in Nematic Liquid Crystals with Positive Dielectric Anisotropy.II.Theoretical Treatment
- A Molecular Statistical Theory of Antiferroelectric Smectic A Liquid Crystals
- A Molecular Field Treatment of Nematic Liquid Crystalline Mixtures:Effects of the Intermolecular Requlsions on Nematic-Isotropic Phase Transition in Binary Mixtures
- (100)-Oriented 3C–SiC Polycrystalline Film Grown on SiO2 by Hot-Mesh Chemical Vapor Deposition Using Monomethylsilane and Hydrogen
- Transmission Ellipsometry of 4-Octyl-4$'$-Cyanobiphenyl Liquid-Crystalline Free-Standing Films
- Effects of Spatial Dispersion on the Wave Propagation in the Magnetoplasma of Semimetals
- Evaluation of the Correspondence between Carbon Incorporation and the Development of c($4\times 4$) Domains
- Characterization of Bistable Hybrid-Twisted Nematic Liquid Crystal Mode by Means of Renormalized Transmission Spectroscopic Ellipsometry
- Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry : Structure and Mechanical and Thermal Properties of Condensed Matter
- A New Type of Electrohydrodynamic Instability in Nematic Liquid Crystals with Positive Dielectric Anisotropy.I.The Existence of the Charge Injection and the Diffusion Current
- Improvement in Crystallinity of ZnO Films Prepared by rf Magnetron Sputtering with Grid Electrode
- Surface Azimuthal Anchoring Energy between the Grating Surface and Nematic Liquid Crystal Layer Studied by Finite Element Method
- Determination of Polar Anchoring Strength at Vertical Alignment Nematic Liquid Crystal-Wall Interface Using Thin Hybrid Alignment Nematic Cell
- Optical Compensation Method for In-plane Switching Twisted Nematic Mode
- Viewing Angle Characteristics and Cell Gap Tolerance of the In-plane Switching Twisted Nematic Mode
- Amorphous In-Plane Switching Twisted Nematic Liquid Crystal Displays Fabricated without Rubbing Process Show a Wide Viewing Angle and Fast Response Characteristics
- Electro-Optical Properties of the In-Plane Switching Twisted Nematic Mode
- Measurement of Genuine Azimuthal Anchoring Energy in Consideration of Liquid Crystal Molecular Adsorption on Alignment Film
- Determination of Director Profile of Twisted Nematic Liquid Crystal Cell with Tilted Surface Alignment by Renormalized Transmission Ellipsometry
- Offset of Multiple-Beam Interference inside Anisotropic Multilayered Structure: Determination of Polar Anchoring Strength at Nematic Liquid Crystal-Wall Interface
- Evaluation of Polar Anchoring Energy Based on Symmetric Oblique Incident Transmission Ellipsometry Method: the Voltage Diminution by Alignment Films
- Study of Liquid Crystal Display Fabricated Using Slit Coater under Two Ultraviolet Irradiation Conditions
- Low-Temperature Heteroepitaxial Growth of SiC on (100) Si Using Hot-Mesh Chemical Vapor Deposition
- Characterization of Liquid Crystal Layer and Cholesteric Film by Renormalized Spectroscopic Ellipsometry
- Effect of Plasma Parameter Control on the Growth of Zincblende Type GaN Films by ECR Plasma Enhanced Metalorganic Chemical Vapor Deposition
- A Method for Determination of Elastic Constants $K_{1}$, $K_{2}$, $K_{3}$ of a Nematic Liquid Crystal Only Using a Homogeneously Aligned Cell
- Study of Liquid Crystal Display Fabricated Using Slit Coater under Two Ultraviolet Irradiation Conditions (Special Issue : Printed Electronics)
- Renormalized Ellipsometry for Determining the Anisotropic Refractive Indices of Nematic Liquid Crystals
- Time-Resolved FT-IR Study of Electric-Field Induced Homogeneous-to-Homeotropic Transition of Nematic 4-Pentyl-4'-cyanobiphenyl : Condensed Matter
- Electrooptical Properties of Vertically Aligned Twisted Nematic Cells with Negative Dielectric Anisotropy
- Extensive Control of Plasma Parameters in the Afterglow Region of Electron-Cyclotron-Resonance Plasma for the Epitaxial Growth of Cubic Gallium Nitride