Investigation of Antiferroelectric Liquid Crystalline Free-Standing Films by Transmission Ellipsometry
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概要
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Thin free-standing films (FSFs) of an antiferroelectric liquid crystal (AFLC) were investigated by transmission ellipsometry. The phase difference between p-polarized and s-polarized light was measured as a function of the temperature and the incidence angle of the light beam. It was found that the structure of an FSF with two layers is anticlinic (SmC^*_A) throughout the temperature range investigated whereas the bulk sample shows several phases, from SmC^*_A to SmA phases. The four layer FSF showed only one phase transition (from SmC^*_A to SmA) in this temperature range. Even for such a thin film as one with five layers, a subphase or subphases between SmC^*_A and SmA were found.
- 社団法人応用物理学会の論文
- 1999-11-15
著者
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AKAHANE Tadashi
Department of Electrical Engineering, Nagaoka University of Technology
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Akahane T
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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MATSUHASHI Nobuaki
Department of Electrical Engineering, Hachinohe National College of Technology
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OKUMOTO Yoshitaka
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology
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KOBAYASHI Haruyoshi
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology
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Okumoto Yoshitaka
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Matsuhashi Nobuaki
Department Of Electrical Engineering Hachinohe National College Of Technology
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Akahane T
Faculty Of Engineering Nagaoka University Of Technology
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Akahane Tadashi
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
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