Characterization of Liquid Crystal Layer and Cholesteric Film by Renormalized Spectroscopic Ellipsometry
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概要
- 論文の詳細を見る
Renormalized transmission spectroscopic ellipsometry (RTSE) is used to evaluate the device parameters of liquid crystal display (LCD). To determine the reduced dielectric and elastic constants, threshold voltage, pretilt angle, cell gap, and surface polar anchoring energy coefficient, symmetrically oblique incidence transmission ellipsometry (SOITE) was applied to vertical-alignment (VA) LCD. It is suggested that the rubbing process on the alignment films for VA LCD does not disturb the measurement of the genuine surface polar anchoring energy coefficient. RTSE is also applicable to the determination of the total twist angle of the cholesteric film.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2009-03-25
著者
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Kimura Munehiro
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
-
Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
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Onuma Toshihiko
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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Kamada Hirokazu
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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