Renormalized Ellipsometry for Determining the Anisotropic Refractive Indices of Nematic Liquid Crystals
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概要
- 論文の詳細を見る
Renormalized transmission ellipsometry was applied to the precise measurement of anistropic refractive indices of nematic liquid crystals. It is quite beneficial for electrical industry that the conventional sandwich-type liquid crystal cell becomes an applicable sample and experimental measurement can be carried out using a conventional instrument for transmission ellipsometry. A simplified measurement procedure can provide continuous values of refractive indices within the visible wavelength range. At the same time, the cell gap and twist angle of the liquid crystal cell can be estimated by this measurement precisely.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2003-02-15
著者
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Tanaka Norihiko
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
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Kimura Mumehiro
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Kimura Mumehiro
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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