High-Resolution Examination of Recording Marks in Phase-Change Media Using a Scanning Near-Field Optical Microscope
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-06-15
著者
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SAIKI Toshiharu
Kanagawa Academy of Science and Technology
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TADOKORO Toshiyasu
Spectroscopic Instruments Division, JASCO Corporation
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Ichihara Katsutaro
Corporate Research And Development Center Toshiba Corporation
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Tadokoro Toshiyasu
Spectroscopic Instruments Division Jasco Corporation
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Ichihara Katsutaro
Corporate Research And Development Center Toshiba Corp.
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Yusu Keiichiro
Corporate Research And Development Center Toshiba Corporation
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Yusu Keiichiro
Corporate Research & Development Center, Toshiba Corp., 1 Komukai-Toshiba-cho, Saiwai-ku, Kawasaki 212-8582, Japan
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