TADOKORO Toshiyasu | JASCO Corporation
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概要
関連著者
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TADOKORO Toshiyasu
JASCO Corporation
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Toriumi Hirokazu
Department Of Chemistry College Of Arts And Science The University Of Tokyo
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Okutani Satoshi
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Kimura Munehiro
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Toriumi Hirokazu
Department Of Chemistry College Of Arts And Sciences The University Of Tokyo
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Akahane Tadashi
Deparment Of Electrical Engineering Faculty Of Engineering The Technological University Of Nagaoka
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Akao Ken-ichi
JASCO Corporation
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木村 睦
Department Of Electronics And Informatics Ryukoku University
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AKAHANE Tadashi
Department of Electrical Engineering, Nagaoka University of Technology
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TORIUMI Hirokazu
Department of Chemistry, College of Arts and Science, The University of Tokyo
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KIMURA Munehiro
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology
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OKUTANI Satoshi
Department of Electrical Engineering, Faculty of Engineering, Nagaoka University of Technology
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Akahane T
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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TADOKORO Takashi
NTT Opto-electronics Laboratories
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AKAO Kenichi
JASCO Corporation
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Akahane T
Faculty Of Engineering Nagaoka University Of Technology
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Akahane Tadashi
Department Of Electrical Engineering Faculty Of Engineering Nagaoka University Of Technology
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Kimura Mutsumi
Ryukoku University:innovative Materials And Processing Research Center
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FUKAZAWA Tomoyuki
JASCO Co., Ltd.
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Tadokoro Toshiyasu
Jasco Corporation Spectroscopic Instruments Division
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Fukazawa Tomoyuki
Jasco Corporation Spectroscopic Instruments Division
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Okutani Satoshi
Department of Electrical Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
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Akahane Tadashi
Department of Electrical Engineering, Nagaoka University of Technology, 1603-1 Kamitomioka, Nagaoka, Niigata 940-2188, Japan
著作論文
- Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
- Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry
- Real Time Analysis of Liquid Crystal Surface Orientation Dynamic Using Polarization Modulated Spectroellipsometry
- Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry