Adsorption of Fluorinated C_<60> on the Si(111)-(7 × 7) Surface Studied by Scanning Tunneling Microscopy and High-Resolution Electron Energy Loss Spectroscopy(Surfaces, Interfaces, and Films)

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2002-01-15

著者

• Hauge Robert

  Department of Electrical and Computer Engineering, Rice University

• 藤川 安仁

  東北大金研

• SAKURAI Toshio

  Institute for Materials Research (IMR), Tohoku University

• Hauge Robert

  Department Of Chemistry And Rice Quantum Institute Rice University

• Sakurai Toshio

  Institute For Materials Research (imr) Tohoku University

• FUJIKAWA Yasunori

  Institute for Materials Research, Tohoku University

• SADOWSKI Jerzy

  Institute for Materials Research, Tohoku University

• KELLY Kevin

  Institute for Materials Research, Tohoku University

• NAKAYAMA Koji

  Institute for Materials Research, Tohoku University

• MICKELSON Edward

  Department of Chemistry and Rice Quantum Institute, Rice University

• MARGRAVE John

  Department of Chemistry and Rice Quantum Institute, Rice University

• Kelly K

  Institute For Materials Research Tohoku University

• Nakayama Koji

  Institute For Materials Research Tohoku University

• Margrave John

  Department Of Chemistry And Rice Quantum Institute Rice University

• Mickelson Edward

  Department Of Chemistry And Rice Quantum Institute Rice University

• Fujikawa Yasunori

  Institute For Materials Research Tohoku University

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