Structure of the Bi/Si(111) Surface by Field-Ion Scanning Tunneling Microscopy
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概要
- 論文の詳細を見る
A combination of LEED and FI-STM has been used to characterize the Bi/Si(111) system. Two distinct phases of the √<3>×√<3> structure formed on the Si(111) surface are imaged for the first time by STM and are studied as a function of coverage. Trimers of Bi atoms are clearly resolved at 1 ML whereas single Bi atom adsorption are documented at 1/3 ML. The atomic geometry of these structures and the development of two phases as a function of coverage are discussed.
- 社団法人応用物理学会の論文
- 1993-03-30
著者
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Park Chan
Institute For Materials Research Tohoku University:(present Address) Jeonbug National University
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Sakurai T
Institute For Materials Research (imr) Tohoku University
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Sakurai Toshio
Institute For Materials Research (imr) Tohoku University
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Hashizume Tomihiro
Institute For Materials Research (imr) Tohoku University
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BAKHTIZIN Raouf
Institute for Materials Research, Tohoku University
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Bakhtizin Raouf
Institute For Materials Research Tohoku University:(present Address) Bashkir State University
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Park Chan
Institute For Laser Engineering Kyung Hee University
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