Anomalous Permeation of Low Energy Neon Atoms in Tungsten at Low Temperatures
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概要
- 論文の詳細を見る
Atomic depth profiles of tungsten tips irradiated with neon atoms of low thermal energy [i) 77 K ii) 300 K] were measured with the aid of an atom-probe field ion microscope. The tip temperature was maintained usually at 25 ± K during the course of atom-probe measurements to practically eliminate thermal diffusion. In the case of i), neon atoms were detected at locations as deep as 300 layers from the surface, a depth much greater than that predicted assuming the usual diffusion mechanism. In the case of ii), however, no neon atoms were detected in the matrix. At present no theory seems to have been established to explain such anomalous penetration of low energy neon atoms.
- 社団法人応用物理学会の論文
- 1986-03-20
著者
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HASHIZUME Tomihiro
Institute for Materials Research (IMR), Tohoku University
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Hashizume T
Hitachi Ltd. Saitama Jpn
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Hyodo S
Institute For Materials Research (imr) Tohoku University : Physics Department Meiji University
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Hyodo Shin-ichi
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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Sakai Akira
The Institute of Low Temperature Science, Hokkaido University
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Fukatsu Susumu
Department Of Applied Physics Faculty Of Engineering The University Of Tokyo
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HASHIZUME Tomihiro
The Institute for Solid State Physics, The University of Tokyo
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SAKURAI Toshio
The Institute for Solid State Physics, The University of Tokyo
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Hashizume Tomihiro
Institute For Materials Research (imr) Tohoku University
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Sakai Akira
The Institute Of Low Temperature Science Hokkaido University
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Sakai Akira
The Institute For Solid State Physics The University Of Tokyo
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Sakurai Toshio
The Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577, Japan
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