Recent Atom Probe Studies at IMR : a Comprehensive Review(APFIM/FIM)
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概要
- 論文の詳細を見る
This paper reviews our recent atom probe research activities conducted at Institute for Materials Research (IMR), Tohoku University, during a period of 1990 to date. The atom probe research started at IMR when the authors constructed an energy compensated time-of-flight atom probe in 1990. Since then, this instrument has been employed for various metallurgical problems, providing better understandings to mechanisms of microstructural evolution in various metallic materials. Notable achievements are studies of precipitation processes in aluminum alloys, nanocrystallization processes of amorphous alloys, microstructural characterizations of magnetic thin films and various other metallic materials. A new instrument equipped with a reflectron type time-of-flight atom probe and a position sensitive atom probe (PoSAP) was constructed in 1994. This instrument allowed three dimensional visualizations of atom distributions in alloys with an atomic resolution. PoSAP has been employed to characterize microstructures in Cr-Fe and Co-Cr(-Ta) magnetic alloys.atom probefield ion microscopeFIMAPFIMamorphousnanocrystalmicrostructurephase transformationprecipitation
- 東北大学の論文
- 1997-03-31
著者
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Sakurai Toshio
Institute For Materials Research (imr) Tohoku University
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HONO Kazuhiro
National Institute for Materials Science
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Hono K
National Inst. For Materials Sci. Tsukuba Jpn
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Hono K
National Research Institute For Metals
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Hono Kazuhiro
National Inst. For Materials Sci. (nims) Ibaraki Jpn
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Hono Kazuhiro
Institute For Materials Research (imr) Tohoku University:(present Address)national Research Institut
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Hono Kazuhiro
Graduate School Of Pure And Applied Sciences University Of Tsukuba
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Hono Kazuhiro
National Institute For Materials Science Tsukuba
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SAKURAI Toshio
Institute for Materials Research, Tohoku University
関連論文
- Orientational Ordering of C_ Adsorbed on the Cu(111)1x1 Surface Studied by the FI-STM
- Field Ion-Scanning Tunneling Microscopy of Metallofullerenes Adsorbed on the Si(100)2×1 Surface
- Field Ion-Scanning Tunneling Microscopy Study of C_ on the Si(100) Surface
- Field Ion-Scanning Tunneling Microscopy Study of C_60 on the Si(100) Surface
- Scanning Tunneling Microscope Study of the Structural Transformation of the Si(111)7×7 Surface to the Na-Induced 3×1 Surface
- An Observation of Benzotriazole (BTA) Adsorption on Cu(110) by the Ultra High Vacuum (UHV)-Scanning Tunneling Microscope (STM) and Low Energy Electron Difiraction (LEED)
- L1_0 FePt-C Nanogranular Perpendicular Anisotropy Films with Narrow Size Distribution
- Adsorption of Fluorinated C_ on the Si(111)-(7 × 7) Surface Studied by Scanning Tunneling Microscopy and High-Resolution Electron Energy Loss Spectroscopy(Surfaces, Interfaces, and Films)
- C_ Grown on the Cu(111)1×1 Surface
- High Resolution Field Emission Spectra from Niobium (100) Tip Surface(APFIM/FIM)
- Mechanical Properties of Bulk Amorphous Zr-Al-Cu-Ni-Ag Alloys Containing Nanoscale Quasicrystalline Particles
- High Strength and Good Ductility of Bulk Quasicrystalline Base Alloys in Zr_Al_Ni_Cu_Pd_X System
- Antiferromagnetism and Spin Polarization in Double Perovskite SrLaVMoO_6
- Microstructure Feature of Bulk Glassy Cu_Zr_Ti_ Alloy in As-cast and Annealed States
- STM Study of C_2H_2 Adsorption on Si(100)(STM-Si(001))
- Charge Transfer of C_ on Copper Surfaces(STM-C_)
- Formation of an Icosahedral Quasicrystalline Phase in Zr_Al_Ni_M_ (M = Pd, Au or Pt) Alloys
- Giant Peltier Effect in a Submicron-Sized Cu-Ni/Au Junction with Nanometer-Scale Phase Separation
- Microstructural Evolution in an Al-1.7 at%Cu Alloy Deformed by Equal-Channel Angular Pressing
- Observation of Clean and Oxygen-Adsorbed Pt(113) Surfaces by Scanning Tunneling Microscopy
- N-Plasma Assisted Molecular Beam, Epitaxy of GaN(0001^^-) Thin Films on 6H-SiC(0001^^-)
- Scanning Tunneling Microscopy of the GaAs(001) Surface Reconstructions(STM-GaAs)
- FI-STM Investigation of Fullerenes Adsorbed on the Semiconductor and Metal Surfaces(STM-C_)
- Scanning Tunneling Microscopy Measurements of the Local Work Function around Steps on the Au/Cu(111) Surface(STM-local states)
- Sound-Wave-Like Collective Electronic Excitations in Au Atom Chains(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- Scanning Tunneling Microscopy of C_ on the Si(111)7 × 7 Surface
- Clustering and Precipitation Processes in Microalloyed Aluminium Alloys(APFIM/FIM)
- Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder
- The Absolute Coverage of K on the Si(111)-3×1-K Surface
- Scanning Tunneling Microscopy of Oxygen and Sodium Adsorption on the Si(111) Surface
- Adsorption Structure of the Na-Saturated Si(100)2×1 Surface Studied by Field-Ion Scanning Tunneling Microscopy/Spectroscopy
- Coverage-Dependent Growth Structures of Sodium on the GaAs(110) Surface
- Adsorption of Na on the GaAs(110) Surface Studied by the Field-Ion-Scanning-Tunneling-Mieroscopy
- Field Ion-Scanning Tunneling Microscopy Study of Sulfur/Chlorine Adsorption on the Cu(111) 1 × 1 Surface
- Field Ion Microscopy of C_ Molecules(APFIM/FIM)
- Effect of Surface Polarity on Gallium Adsorption on 6H-SiC(0001) Surfaces : An STM Study(STM-other surfaces)
- Field Ion Scanning Tunneling Microscopy and Its Application to Oxygen Adsorption on the Ag(110) 1×1 Surface
- Factors Controlling Irradiation Hardening of Iron-Copper Model Alloy
- TEM/3DAP characterizations of severely deformed two phase nanostructures
- Ordering of Missing-Row-Defects Forming (2×n)-Bi Phases on the Si(100) 2×1 Surface Studied by the Scanning Tunneling Microscopy
- Structure of the Bi/Si(111) Surface by Field-Ion Scanning Tunneling Microscopy
- Scanning Tunneling Microscopy of √×√-Bi Reconstruction on the Si(111) Surface
- Spatial Variation of Local Work Function of the Au/Cu(111) and Pd/Cu(111) Systems(STM-local states)
- Initial Stages of Cubic GaN Growth on the GaAs(001) Surface Studied by Scanning Tunneling Microscopy
- Recent Atom Probe Studies at IMR : a Comprehensive Review(APFIM/FIM)
- Field Ion-Scanning Tunneling Microscopy Study of the Ag (110)-O System
- PREFACE
- Atomic Structure of Faceted Planes of InAs Quantum Dots on GaAs (001) Studied by Scanning Tunneling Microscopy
- Indium-rich 4x2 Reconstruction in Novel Growth of InAs on the GaAs(001)(STM-BEEM interfaces)
- Microstructures and the Magnetic Properties of Fe_3B/(Nd, Dy)_2Fe_B Nanocomposite Microalloyed with Cu and Zr
- Lattice Parameter and Thermal Expansion Measurements of a LiF(001)Surface by He-Atom Beam Diffraction Method
- GaAs(100) (2×4) Surface Study by Molecular Beam Epitaxy and Field-Ion-Scanning-Tunneling-Microscopy
- Spin Polarization of Alternate Monatomic Epitaxial 〔Fe/Co〕n Superlattice
- Microscopic Observation of the Interface between a Tool Surface and Deposits of Low-Carbon Free Cutting Steel
- Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis
- Growth of a High-Quality Ultrathin Fe(001) Layer on MgO(001) by Insertion of an Ultrathin \gamma-Fe
- Growth of a High-Quality Ultrathin Fe(001) Layer on MgO(001) by Insertion of an Ultrathin γ-Fe₂O₃ Layer