Field Ion-Scanning Tunneling Microscopy Study of C_<84> on the Si(100) Surface

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1993-01-15

著者

• Nishina Yuichiro

  Institute for Materials Research, Tohoku University

• Wang Xiangdong

  Institute For Materials Research (imr) Tohoku University

• HASHIZUME Tomihiro

  Institute for Materials Research (IMR), Tohoku University

• SHINOHARA Hisanori

  Chemistry Department, Nagoya University

• SAKURAI Toshio

  Institute for Materials Research (IMR), Tohoku University

• WANG Xiang-Dong

  Institute for Materials Research (IMR), Tohoku University

• SHINOHARA Hisanori

  Institute for Materials Research (IMR), Tohoku University

• SAITO Yahachi

  Institute for Materials Research (IMR), Tohoku University

• Wang Xiangdong

  神戸大学医学部附属医学研究国際交流センター院生

• Wang Xiang-dong

  Institute For Materials Research (imr) Tohoku University

• Saito Yahachi

  Institute For Materials Research (imr) Tohoku University

• Sakurai Toshio

  Institute For Materials Research (imr) Tohoku University

• Nishina Yuichiro

  Institute For Materials Research (imr) Tohoku University

• Shinohara H

  Department Of Chemistry Nagoya University

• Shinohara Hisanori

  Chemistry Department Nagoya University

• Shinohara H

  Nagoya Univ. Nagoya Jpn

• Wang X

  Tokyo Inst. Technol. Yokohama Jpn

• Hashizume Tomihiro

  Institute For Materials Research (imr) Tohoku University

• Shionohara Hisanori

  Department Of Chemistry For Materials Faculty Of Engineering Mie Univetsity

• HASHIZUME Tomihiro

  Institute for Materials Research (IMR), Tohoku University:(Present address)Advanced Research Laboratory, Hitachi Ltd.

• SHINOHARA Hisanori

  Institute for Clinical Research, Zentsuji National Hospital

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