Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis
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概要
- 論文の詳細を見る
By using an external X-ray source for photoemission, an ultrahigh vacuum scanning tunneling microscope (UHV-STM) was successfully used to detect and map a tip current induced by X-ray irradiation simultaneously with a tunneling current. Apparent height in the STM image rises by the X-ray induced current on the Au/Cu (111) and Si (111) 7×7 surfaces. Relative height increase of the Au overlayer to Cu substrate in STM images was found to depend on the X-ray irradiation, suggesting that it may be a promising tool for elemental analysis in STM.
- 社団法人応用物理学会の論文
- 1998-11-01
著者
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WAGATSUMA Kazuaki
Institute for Materials Research, Tohoku University
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Sakurai Toshio
Institute For Materials Research (imr) Tohoku University
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Hasegawa Yukio
Institute for Materials Research, Tohoku University
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Tsuji Kouichi
Institute For Materials Research Tohoku University
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Hasegawa Yukio
Institute For Materials Research (imr) Tohoku University And Precursory Research For Embryonic Scien
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Wagatsuma Kazuaki
Institute For Materials Research Tohoku University
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SAKURAI Toshio
Institute for Materials Research, Tohoku University
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