Tsuji Kouichi | Institute For Materials Research Tohoku University

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概要

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著作論文

Effect of Surface Roughness on Takeoff-Angle-Dependent X-Ray Fluorescence of Ultrathin Films at Glancing Incidence
Material Analysis Methods Applied to the Study of Ancient Monuments, Works of Art and Artefacts
Characterization of Small Areas of Thin-Films by Grazing-Exit Electron Probe X-ray Microanalysis
Estimation of Chemical Sputtering Rates of Carbon in He-H_2 Glow Discharge Plasmas by Optical Emission Spectroscopy
X-Ray Fluorescence Analysis by Multiple-Glancing X-Ray Beam Excitation
Experimental Evaluation of the MoK_α X-Ray Probing Depth for a GaAs Wafer in a Total-Reflection X-Ray Fluorescence Analysis
Optimum Gaseous Pressure for Measurement of the X-Ray Excited Scanning Tunneling Microscope Tip Current
Grazing-Exit X-Ray Spectrometry for Surface and Thin-Film Analyses
Solid Surface Density Determination Using the Glancing-Takeoff X-Ray Fluorescence Method
Airborne Particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-ray Microanalysis and Energy Dispersive X-ray Fluorescence Analysis
X-Ray Excited Current Detected with Scanning Tunneling Microscope Equipment
Characterization of Au Thin Film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy
Fast Electrons from Grimm Glow Discharge Helium Plasmas
Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis

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