Experimental Evaluation of the MoK_α X-Ray Probing Depth for a GaAs Wafer in a Total-Reflection X-Ray Fluorescence Analysis
スポンサーリンク
概要
著者
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Oku T
Osaka Univ. Osaka Jpn
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Tsuji K
Institute For Materials Research Tohoku University
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Tsuji Kouichi
Institute For Materials Research Tohoku University
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Wagatsuma Kazuaki
Institute For Materials Research Tohoku University
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OKU Takeo
National Center for HREM, Lund University
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