Airborne Particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-ray Microanalysis and Energy Dispersive X-ray Fluorescence Analysis
スポンサーリンク
概要
著者
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Tsuji Kouichi
Institute For Materials Research Tohoku University
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Tsuji K
Techno Tsuji Ltd. Ld. Toyama
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Grieken Rene
Department Of Chemistry University Of Antwerp
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INJUK Jasna
Department of Chemistry, University of Antwerp
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OSAN Janos
Department of Chemistry, University of Antwerp
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Osan Janos
Department Of Chemistry University Of Antwerp
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Injuk Jasna
Department Of Chemistry University Of Antwerp
関連論文
- Effect of Surface Roughness on Takeoff-Angle-Dependent X-Ray Fluorescence of Ultrathin Films at Glancing Incidence
- Material Analysis Methods Applied to the Study of Ancient Monuments, Works of Art and Artefacts
- Characterization of Small Areas of Thin-Films by Grazing-Exit Electron Probe X-ray Microanalysis
- Estimation of Chemical Sputtering Rates of Carbon in He-H_2 Glow Discharge Plasmas by Optical Emission Spectroscopy
- X-Ray Fluorescence Analysis by Multiple-Glancing X-Ray Beam Excitation
- Experimental Evaluation of the MoK_α X-Ray Probing Depth for a GaAs Wafer in a Total-Reflection X-Ray Fluorescence Analysis
- Optimum Gaseous Pressure for Measurement of the X-Ray Excited Scanning Tunneling Microscope Tip Current
- Grazing-Exit X-Ray Spectrometry for Surface and Thin-Film Analyses
- Solid Surface Density Determination Using the Glancing-Takeoff X-Ray Fluorescence Method
- Airborne Particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-ray Microanalysis and Energy Dispersive X-ray Fluorescence Analysis
- X-Ray Excited Current Detected with Scanning Tunneling Microscope Equipment
- Characterization of Au Thin Film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy
- Fast Electrons from Grimm Glow Discharge Helium Plasmas
- Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis