Effect of Surface Roughness on Takeoff-Angle-Dependent X-Ray Fluorescence of Ultrathin Films at Glancing Incidence

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1994-11-15

著者

• HIROKAWA Kichinosuke

  Institute for Materials Research, Tohoku University

• Tsuji Kouichi

  Institute For Materials Research Tohoku University

• SASAKI Atsushi

  Furukawa Electric Co.,

• Hirokawa Kichinosuke

  Institute For Materials Research Tohoku University

• Sasaki Atsushi

  Furukawa Electric Co.

関連論文

• Transport and Magnetic Properties of Pb_2Sr_2Y_Ca_xCu_3O_ : II-D Transport Properties : II Oxide Superconductors; Experiments II : Electronic States
• Effect of Surface Roughness on Takeoff-Angle-Dependent X-Ray Fluorescence of Ultrathin Films at Glancing Incidence
• Material Analysis Methods Applied to the Study of Ancient Monuments, Works of Art and Artefacts
• Characterization of Small Areas of Thin-Films by Grazing-Exit Electron Probe X-ray Microanalysis
• Electron Microscopic Observation of the Reduction Process of Indium Oxide to Indium Metal and on the Formation of a Palladium-Indium Intermetallic Compound in a Thermal Pretreatment Process in Graphite-Furnace Atomic Absorption Spectrometry
• Observation of Vaporization in Palladium-Indium Intermetallic Compounds by Graphite Furnace Atomic Absorption Spectrometry Using Transmission Electron Microscopy
• Determination of Valence of Copper and Oxygen Deficiency in Superconducting Sr_xLa_CuO_
• Estimation of Chemical Sputtering Rates of Carbon in He-H_2 Glow Discharge Plasmas by Optical Emission Spectroscopy
• X-Ray Fluorescence Analysis by Multiple-Glancing X-Ray Beam Excitation
• Experimental Evaluation of the MoK_α X-Ray Probing Depth for a GaAs Wafer in a Total-Reflection X-Ray Fluorescence Analysis
• Optimum Gaseous Pressure for Measurement of the X-Ray Excited Scanning Tunneling Microscope Tip Current
• Grazing-Exit X-Ray Spectrometry for Surface and Thin-Film Analyses
• Solid Surface Density Determination Using the Glancing-Takeoff X-Ray Fluorescence Method
• Airborne Particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-ray Microanalysis and Energy Dispersive X-ray Fluorescence Analysis
• X-Ray Excited Current Detected with Scanning Tunneling Microscope Equipment
• Characterization of Au Thin Film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy
• Fast Electrons from Grimm Glow Discharge Helium Plasmas
• Determination of Cadmium in High-Purity Zinc by Electrothermal Atomic Absorption Spectrometry after Coprecipitation with Iron(III) Hydroxide
• Detection of X-ray Induced Current Using a Scanning Tunneling Microscope and its Spatial Mapping for Elemental Analysis

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