Photoreflectance Characterization of Interfacial Residual Strain in InGaAs/GaAs Strained Single Quantum Well Structure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-01-01
著者
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Takemasa Keizo
Opto-electronics Laboratories Research And Development Group Oki Electric Industry Co. Ltd.
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Kamijoh Takeshi
Optoelectronics Technology Research Laboratory
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Kamijoh Takeshi
Opto-electronics Laboratories R&d Group Oki Electric Industry Co. Ltd.
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Kamihoh T
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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Kamijoh Takeshi
Research And Development Group Oki Electric Industry Co. Ltd.
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Watanabe K
Tokyo Institute Of Technology Faculty Of Bioscience And Biotechnology Department Of Biological Scien
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Watanabe K
Department Of Physics Tokyo University Of Science
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WATANABE Kenji
Research and Development Group, Oki Electric Industry Co. Ltd.
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TAKAMORI Takeshi
Research and Development Group, Oki Electric Industry Co. Ltd.
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Kamijoh T
Oki Electric Co. Ltd. Hachioji‐shi Jpn
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Takamori T
Opto-electronics Laboratories R&d Group Oki Electric Industry Co. Ltd.
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