A Novel Gain Measurement Technique for Design of Long-Wavelength Vertical Cavity Lasers
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概要
- 論文の詳細を見る
We have developed a novel gain measurement technique based on a surface-normal optical pump-probe arrangement. The sample is optically pumped at 1.48μm, and single-pass optical gain is obtained from the transmitted power of a 1.55-μm probe beam. Using this technique, gain can be measured accurately up to high excitation levels. In addition, the technique allows gain to be measured from as-grown wafers and can be used to optimize the active-layer parameters more conveniently by circumventing complicated device fabrication. The measured gain can also predict the minimum mirror reflectivity for laser oscillation in vertical cavity lasers.
- 社団法人応用物理学会の論文
- 1997-10-15
著者
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KAMIJOH Takeshi
Semiconductor Technology Laboratory, Oki Electric Industry Co. Ltd.
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Kamijoh T
Oki Electric Co. Ltd. Hachioji‐shi Jpn
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TAKEMASA Keizo
Semiconductor Technology Laboratory, Oki Electric Industry Co., Ltd.
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WADA Hiroshi
Semiconductor Technology Laboratory, Oki Electric Industry Co., Ltd.
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KAMIJOH Takeshi
Semiconductor Technology Laboratory, Oki Electric Industry Co., Ltd.
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