Calculations of Energy Levels of Oxygen and Silicon Vacancies at the Si-SiO_2 Interface
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1973-01-05
著者
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SUGANO Takuo
Department of Electrical and Electronic Engineering, Toyo University
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Iizuka Tetsuya
Department Of Electronic Engineering Faculty Of Engineering University Of Tokyo:(present Address) Re
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Iizuka Tetsuya
Department Of Electronic Engineering Faculty Of Engineering University Of Tokyo
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Iizuka Tetsuya
Department Of Electronic Engineering And Vlsi Design And Education Center (vdec) The University Of T
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