Dielectric Measurements in the 60-GHz Band Using a High-Q Gaussian Beam Open Resonator
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概要
- 論文の詳細を見る
A full confocal Gaussian beam open resonator system that determines the dielectric properties of low-loss materials in the 60-GHz band is developed. To achieve high Q values a quasi-optical coupling method is used to feed the resonator. It is connected to a computer-controlled HP 8510C vector network analyzer for automatic measurement. The frequency variation method is used and the data are processed using the open resonator scalar theory. Results from 96% and 99.5% alumina samples with thicknesses ranging from 0.38 mm to 1 mm, are presented in the V band, with loss tangent values of the order of 100μ radians. This system should be able to measure substrates as thin as less than 0.1 mm to 0.3 mm, which are the thicknesses of substrates in practical use.
- 社団法人電子情報通信学会の論文
- 1995-08-25
著者
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MATSUI Toshiaki
Communication Research Laborator
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Matsui Toshiaki
Communications Research Laboratory Ministry Of Posts And Telecommunications
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Mimura Takashi
National Institute Of Information And Communications Technology (nict)
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Matsui Toshiaki
National Institute Of Information And Communications Technology (nict)
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Coquet Philippe
Equipe Antennes Et Technologies
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Coquet Philippe
Communications Research Laboratory-MPT
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Kiyokawa Masahiro
Communications Research Laboratory-MPT
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