Ni_<80>Fe_<20>薄膜における強磁性共鳴線幅の下地層依存性

概要

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In order to clarify the correlation between ferromagnetic resonance (FMR) linewidth and stractural inhomogenity, the FMR linewidth for 80NiFe(Py) thin films with various bufferlayer materials and thicknesses was measured. Py thin films (40Å) were fabricated by sputtering on 7059 glass substrate with various buffer layers: Cu, Pt, Pd, and Ta. The out-of-plane angular dependence of the FMR was analyzed using a model that takes account of Gilbert damping of spin precession, the distribution of the effective demagnetization, and the local fluctuation of the angle between the normal direction of the Py film and the external magnetic field. The fluctuation of the angle increased with increasing average roughness (R_a) of the surface on buffer layers measured by AFM, and was therefore, considered to be due to the waviness of the Py layer.
2000-04-15