Ouchi Kiyoshi | Central Research Laboratory Hitachi Ltd.
スポンサーリンク
概要
関連著者
-
Ouchi Kiyoshi
Central Research Laboratory Hitachi Ltd.
-
OUCHI Kiyoshi
Central Research Laboratory, Hitachi, Ltd.
-
Oka Tohru
Central Research Laboratory Hitachi Ltd.
-
MOCHIZUKI Kazuhiro
Central Research Laboratory, Hitachi Ltd.
-
Mochizuki K
Central Research Laboratory Hitachi Ltd.
-
Mochizuki Kazuhiro
Central Research Lab.hitachi Ltd.
-
Mishima Tomoyoshi
Central Research Lab. Hitachi Ltd.
-
MISHIMA Tomoyoshi
Central Research Laboratory, Hitachi, Ltd.
-
Mishima T
Central Research Laboratory Hitachi Ltd.
-
Kudo Makoto
Central Research Lab. Hitachi Ltd.
-
TANOUE Tomonori
Central Research Laboratory, Hitachi, Ltd.
-
Tanoue T
Central Research Laboratory Hitachi Ltd.
-
Tanoue Tomonori
Central Research Laboratory Hitachi Ltd.
-
KUDO Makoto
Central Research Laboratory, Hitachi, Ltd.
-
Nakamura T
National Defense Acad. Kanagawa Jpn
-
NIKI Toshikazu
Ishikawa Seisakusho, Ltd.
-
Nakamura Takanori
Functional Materials Research Dept. R & D Div. Murata Manufacturing Co. Ltd.
-
Kudo Makoto
Central Research Laboratory Hitachi Ltd.
-
Toyoshima Yasutake
Electrotechnical Labotatory
-
Toyoshima Yoshiaki
Semiconductor Device Engineering Laboratory Toshiba Corporation
-
NAKAMURA Tohru
Central Research Laboratory, Hitachi, Ltd.
-
Nakamura T
Department Of Earth And Ocean Sciences National Defense Academy
-
Kasai Jun-ichi
Central Research Laboratory Hitachi Ltd.
-
Kudo M
Central Research Laboratory Hitachi Ltd.
-
Suguro K
Toshiba Corporation Semiconductor Company
-
Niki Toshikazu
Ishikawa Seisakusho Ltd.
-
Murakoshi A
Toshiba Corp. Yokohama Jpn
-
Nakamura Tohru
Central Research Lab. Hitachi Ltd.
-
Suguro Kyoichi
Toshiba Corporation Semiconductor Company
-
KASAI Jun-ichi
Central Research Laboratory, Hitachi, Ltd.
-
OHTA Hiroshi
Process Engineering Development Dept., Hitachi ULSI Systems Co., Ltd.
-
MURAKOSHI Atsushi
Process and Manufacturing Engineering Center, Semiconductor Company, Toshiba Corp.
-
SUGURO Kyoichi
Process and Manufacturing Engineering Center, Semiconductor Company, Toshiba Corp.
-
SUGURO Kyoichi
Microelectronics Engineering Laboratory, Semiconductor Company, Toshiba Corporation
-
MASUDA Hiroshi
Toei Kogyo Ltd.
-
Toyoshima Yoshiaki
System Lsi Research & Development Center Toshiba Corporation Semiconductor Company
-
OHUCHI Kazuya
System LSI Research & Development Center, Toshiba Corporation Semiconductor Company
-
ADACHI Kanna
System LSI Research & Development Center, Toshiba Corporation Semiconductor Company
-
HOKAZONO Akira
System LSI Research & Development Center, Toshiba Corporation Semiconductor Company
-
KANEMURA Takahisa
System LSI Research & Development Center, Toshiba Corporation Semiconductor Company
-
AOKI Nobutoshi
System LSI Research & Development Center, Toshiba Corporation Semiconductor Company
-
NISHIGOHRI Masahito
Advanced Logic Technology Department, Toshiba Corporation Semiconductor Company
-
OHUCHI Kazuya
Microelectronics Engineering Laboratory, Toshiba Corporation
-
MIYASHITA Katsura
Microelectronics Engineering Laboratory, Toshiba Corporation
-
MURAKOSHI Atsushi
Microelectronics Engineering Laboratory, Toshiba Corporation
-
YOSHIMURA Hisao
Microelectronics Engineering Laboratory, Toshiba Corporation
-
TOYOSHIMA Yoshiaki
Microelectronics Engineering Laboratory, Toshiba Corporation
-
Oka T
Nagaoka Coll. Technol. Niigata Jpn
-
Adachi Kanna
System Lsi Research & Development Center Toshiba Corporation Semiconductor Company
-
Aoki Nobutoshi
System Lsi Research & Development Center Toshiba Corporation Semiconductor Company
-
Hokazono Akira
System Lsi Research & Development Center Toshiba Corporation Semiconductor Company
-
Suguro Kyoichi
Process & Manufacturing Engineering Center Semiconductor Company Toshiba Corporation
-
MASUDA Hiroshi
Central Research Laboratory, Hitachi, Ltd.
-
TERANO Akihisa
Central Research Laboratory, Hitachi, Ltd.
-
SUZUKI Hideyuki
Central Research Laboratory, Hitachi, Ltd.
-
WATANABE Koichi
Central Research Laboratory, Hitachi, Ltd.
-
MATSUBARA Hirokazu
Central Research Laboratory, Hitachi, Ltd.
-
Terano Akihisa
Central Research Laboratory Hitachi Ltd.
-
Yoshimura Hisao
Microelectronics Engineering Laboratory Toshiba Corporation
-
Miyashita K
Seiko Epson Corp. Nagano Jpn
-
Masuda H
Toei Kogyo Ltd.
-
Nishigohri Masahito
Advanced Logic Technology Department Toshiba Corporation Semiconductor Company
-
Murakoshi Atsushi
Process And Manufacturing Engineering Center Semiconductor Company Toshiba Corp.
-
Suzuki Hideyuki
Central Research Laboratory Hitachi Ltd.
-
Ohta Hiroshi
Process Engineering Development Dept. Hitachi Ulsi Systems Co. Ltd.
-
Watanabe Koichi
Central Research Laboratory Hitachi Ltd.
-
Masuda Hiroshi
Central Research Laboratory Hitachi Ltd.
-
Murakoshi Atsushi
Process & Manufacturing Engineering Center, Toshiba Corporation Semiconductor Company
-
Mishima Tomoyoshi
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
-
Kudo Makoto
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601, Japan
著作論文
- Low-Lattice-Strain Long-Wavelength GaAsSb/GaInAs Type-II Quantum Wells Grown on GaAs Substrates
- Gas-Source Molecular Beam Epitaxy Growth of Metamorphic InP/In_Al_As/In_Ga_As/InAsP High-Electron-Mobility Structures on GaAs Substrates
- Ultrashallow Junction Formation for Sub-100nm Complementary Metal-Oxide-Semiconductor Field-Effect Transistor by Controlling Transient Enhanced Diffusion
- Improved Ti Self-Aligned Silicide Technology Using High Dose Ge Pre-Amorphization for 0.10 μm CMOS and Beyond
- Characterization of InGaP/GaAs Heterojunction Bipolar Transistors with a Heavily Doped Base : Semiconductors
- High Performance InP/InGaAs HBTs for 40-Gb/s Optical Transmission ICs (Special Issue on Ultra-High-Speed IC and LSI Technology)
- Fully Strained Heavily Carbon-Doped GaAs Grown by Gas-Source Molecular Beam Epitaxy Using Carbontetrabromide and Its Application to InGaP/GaAs Heterojunction Bipolar Transistors
- A WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Speed and Low-Power InGaP/GaAs HBTs
- Fully Strained Heavily Carbon-Doped GaAs Using Carbontetrabromide by Gas-Source Molecular Beam Epitaxy and Its Application in InGaP/GaAs Heterojunction Bipolar Transistors
- New Technologies of a WSi Base Electrode and a Heavily-Doped Thin Base Layer for High-Performance InGaP/GaAs HBTs
- Increased Hole Mobility of p-GaSb/GaAs Short-Period Superlattices Grown on InP Substrates