X-ray Interference Fringes from Weakly Bent Crystal

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概要

• 論文の詳細を見る

• Topographies of Si 220 reflection in the Bragg mode have been observed from a weakly bent single crystal. When bending is very weak, a novel interference fringe is observed instead of mirage diffraction fringes. The period of this fringe increases with the distance between the incident point of X-rays and the exit point of the diffracted beam. This interference fringe is caused by the interference between a mirage diffraction beam and the reflected beam from the bottom surface. When this interference fringe is observed, the interference fringes are also observed from the lateral surface even when the distance from the incident point to the crystal edge is 12 mm; X-rays propagate over a long distance, i.e., over a centimeter distance in the crystal.

• 2011-08-15

著者

• 平野 健二

  埼玉工大

• HIRANO Kenji

  Saitama Institute of Technology

• FUKAMACHI Tomoe

  Saitama Institute of Technology

• NEGISHI Riichirou

  Saitama Institute of Technology

• HIRANO Keiichi

  Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization

• Kawamura Takaaki

  Department Of Applied Physics School Of Science And Engineering Waseda University

• Jongsukswat Sukswat

  Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan

• Kanematsu Yoshinobu

  Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan

• Shimojo Masayuki

  Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan

• Ju Dongying

  Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan

• Ju Dongying

  Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293

• Shimojo Masayuki

  Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan

• Kanematsu Yoshinobu

  Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293

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