Comparison of RHEED Dynamical Calculation Methods

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1988-06-20

著者

• KAWAMURA Takaaki

  Department of Mathematics and Physics, University of Yamanashi

• Maksym P.

  Department Of Physics University Of Leicester

• ICHIMIYA Ayahiko

  Department of Applied Physics, Faculty of Engineering, Nagoya University

• Ichimiya Ayahiko

  Department Of Applied Physics School Of Engineering Nagoya University

• Ichimiya Ayahiko

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• Kawamura Takaaki

  Department Of Applied Physics School Of Science And Engineering Waseda University

関連論文

• X-ray Interference Fringe of Bragg-(Bragg)^m-Laue Case(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
• Enhancement of Surface Plasmon excitation by Low-Energy Electron due to Surface Resonance on Si (001)-2×1
• X-ray Interference Fringe in Bragg-(Bragg)^m-Laue Case from Thin Finite Crystal
• The Temperature Effect and Surface State Resonance in Medium Energy Elctron Diffraction by Crystals
• Layer-by-Layer Oxidation of Si(001) Surfaces
• Effect of Strong Borrmann Absorption on X-Ray Fluorescence Yield Curves
• Determination of Anomalous Scattering Factor by Using Transmitted Rocking Curves near the Absorption Edge
• Nature of Angle-Resolved Electron Energy Loss Spectrum
• Threshold Behavior of Synchrotron Radiation Photoionization for Bi_n (n≦4)
• X-Rays Beam Condensation by Confinement in a Thin Crystal
• Study of the Si(111)"1 × 1"-An Surface Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy
• Metastable Ordering of Domain Walls into Si(111)(2〔ル-ト21〕×2〔ル-ト21〕)R(±10.9°)-Au Structure Studied by Reflection High Energy Electron Diffraction and Scanning Tunneling Microscopy
• Comparison of RHEED Dynamical Calculation Methods
• Origin of RHEED Intensity Oscillation during Growth Studied by Using Wave Functions
• Photon Stimulated Desorption of Positive Ions from LiF
• Surface Diffusion during Decay of 2-Dimensional Island on Si(100)
• Orgin of Enhanced Borrmann Effect in Asymmetric Laue Case
• Structural Study of the SiC(0001)(√ X √)-R30°Surfaces by Reflection High-Energy Electron Diffraction Rocking Curves : Semiconductors
• Reconstructions of 6H-SiC(0001) Surfaces Studied by Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction
• Surface Morphology Development during Molecular Beam Epitaxy Growth on a GaAs(100) Vicinal Surface
• X-Ray Diffraction Study of Fine Gold Particles Prepared by Gas Evaporation Technique. : I. General Feature
• Development of Energy-Filtered Reflection High-Energy Electron Diffraction Apparatus
• Phase Shift and Frequency Doubling on Intensity Oscillations of Reflection High-Energy Electron Diffraction : One-Beam Dynamical Calculations for Ge on Ge(111) Surface
• Origin of Reducing Domain Boundaries of Si(111)-7×7 during Homoepitaxial Growth
• Formation of Three-Dimensional Silicon Mounds on the Si(111) 7 × 7 Surface Using the Tip of a Scanning Tunneling Microscope : Surfaces, Interfaces, and Films
• Correction to "Many-Beam Calculation of RHEED Intensities by the Multi-Slice Method"
• Intensity of Fast Electrons Transmitted through Thick Single Crystals
• Mean and Anomalous Absorption Coeficients of Electrons for Magnesium Oxide Single Crystal
• Many-Beam Calculation of Reflection High Energy Electron Diffraction (RHEED) Intensities by the Multi-Slice Method
• Structural Study of the Si(111)(√×√)R30° -Au Surface Using One-Beam Reflection High Energy Electron Diffraction Intensity Rocking Curve Analysis
• Analytical Formura of Imaginary Crystal Potential for Fast Electrons
• The Origin of Circular Arc in RHEED:1D Ordered Surface
• RHEED Intensity from Vicinal Si(100) Surfaces
• X-ray Interference Fringes from Weakly Bent Crystal
• Origin of Reflection High Energy Electron Diffraction Intensity Oscillation during Homoepitaxial Growth on GaAs(001)
• Amplification of Reflected X-ray Beams by the Mirage Effect
• First-Principle Calculation of Migration Processes of As during Growth on GaAs(001)
• Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
• Carbonization of Si(111)-$7\times 7$ Surface Using CH4 with Hot Tungsten Filament
• X-ray Interference Fringes in Transmitted Beam of Bragg Mode from Very Weakly Bent Crystal
• Determination of Constant Strain Gradients of Elastically Bent Crystal Using X-ray Mirage Fringes
• Rate of X-ray Beam Confinement in Absorbing Crystal
• X-Rays Beam Condensation by Confinement in a Thin Crystal
• Determination of Anomalous Scattering Factor by Using Transmitted Rocking Curves near the Absorption Edge
• Study of the Si(111)"1×1"–Au Surface Using Reflection High-Energy Electron Diffraction and Scanning Tunneling Microscopy
• Reconstructions of 6H-SiC(0001) Surfaces Studied by Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction
• RHEED and AES study of Si (111).RAD.3*.RAD.3-R30.DEG. structure induced by adsorption of impurity gases.
• An Experimental Study on the Anomalous Transmission of Electrons through Crystals. Measurements with Molybdenite Films at 200 and 500 kV

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