Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
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概要
- 論文の詳細を見る
A novel two-beam X-ray interferometer using two multiple Bragg--Laue (MBL) mode interferometers has been developed. The first MBL interferometer was utilized not only as a monochromator to generate a highly coherent beam but also as a beam splitter. The second MBL interferometer was used as an analyzer. By using this two-beam X-ray interferometer, interference fringes were observed as a function of the thickness of a phase plate inserted in one path of incident X-rays. The visibility of the measured fringes is approximately 25%. Some advantages of this MBL interferometer are pointed out.
- 2011-08-15
著者
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平野 健二
埼玉工大
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HIRANO Kenji
Saitama Institute of Technology
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FUKAMACHI Tomoe
Saitama Institute of Technology
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NEGISHI Riichirou
Saitama Institute of Technology
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HIRANO Keiichi
Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization
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Kawamura Takaaki
Department Of Applied Physics School Of Science And Engineering Waseda University
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Fukamachi Tomoe
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Jongsukswat Sukswat
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Kanematsu Yoshinobu
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Shimojo Masayuki
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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Ju Dongying
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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Hirano Keiichi
Institute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization, Tukuba, Ibaraki 305-0801, Japan
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Shimojo Masayuki
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293, Japan
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Kanematsu Yoshinobu
Saitama Institute of Technology, 1690 Fusaiji, Fukaya, Saitama 369-0293
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